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Efficient parametric characterization of the dynamic performance of an RFID IC

Autor
Capdevila, S.; Jofre, L.; Romeu, J.; Bolomey, J.Ch.
Tipus d'activitat
Article en revista
Revista
IEEE microwave and wireless components letters
Data de publicació
2012
Volum
22
Número
8
Pàgina inicial
436
Pàgina final
438
DOI
https://doi.org/10.1109/LMWC.2012.2205910 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/17182 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp;jsessionid=nb9BQZhpqkxzfq7NLZBZP27C73zh1FGLy9dw0F6ncMSrNsPJN98r!-604091148?arnumber=6237551&contentType=Journals+%26+Magazines Obrir en finestra nova
Resum
In this letter, a measurement technique for a complete parametric characterization of the input impedance of an RFID IC is presented. The use of an SPDT switch to modulate the signal from the network analyzer provides the capability to measure the RFID IC activation level and its input impedance simultaneously. This data can then be used to fully predict the dynamic response and performance of an RFID tag.
Citació
Capdevila, S. [et al.]. Efficient parametric characterization of the dynamic performance of an RFID IC. "IEEE microwave and wireless components letters", 2012, vol. 22, núm. 8, p. 436-438.
Paraules clau
Characterization, Input impedance, Modulated scattering technique (MST), Radio frequency identification (RFID), Single pole double throw (SPDT)
Grup de recerca
ANTENNALAB - Grup d´Antenes i Sistemes Radio

Participants