In this letter, a measurement technique for a complete
parametric characterization of the input impedance of an RFID
IC is presented. The use of an SPDT switch to modulate the signal
from the network analyzer provides the capability to measure the
RFID IC activation level and its input impedance simultaneously.
This data can then be used to fully predict the dynamic response
and performance of an RFID tag.
Capdevila, S. [et al.]. Efficient parametric characterization of the dynamic performance of an RFID IC. "IEEE microwave and wireless components letters", 2012, vol. 22, núm. 8, p. 436-438.