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Quantification of dissipation and deformation in ambient atomic force microscopy

Autor
Santos, S.; Gadelrab, K.R.; Barcons, V.; Stefancich, M.; Chiesa, M.
Tipus d'activitat
Article en revista
Revista
New journal of physics
Data de publicació
2012-07-20
Volum
14
Pàgina inicial
1
Pàgina final
12
DOI
https://doi.org/10.1088/1367-2630/14/7/073044 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/16725 Obrir en finestra nova
URL
http://iopscience.iop.org/1367-2630/14/7/073044 Obrir en finestra nova
Resum
A formalism to extract and quantify unknown quantities such as sample deformation, the viscosity of the sample and surface energy hysteresis in amplitude modulation atomic force microscopy is presented. Recovering the unknowns only requires the cantilever to be accurately calibrated and the dissipative processes occurring during sample deformation to be well modeled. The theory is validated by comparison with numerical simulations and shown to be able to provide, in principle, values of sample d...
Citació
Santos, S. [et al.]. Quantification of dissipation and deformation in ambient atomic force microscopy. "New journal of physics", 20 Juliol 2012, vol. 14, p. 1-12.
Paraules clau
Dissipative process, Energy hysteresis, Picometer resolution, Sample deformation, Unknown quantity
Grup de recerca
PERC-UPC - Centre de Recerca d'Electrònica de Potència UPC
SEPIC - Sistemes Electrònics de Potència i de Control
SSR-UPC - Smart Sustainable Resources

Participants

  • Santos Hernandez, Sergio  (autor)
  • Gadelrab, Karim Raafat  (autor)
  • Barcons Xixons, Victor  (autor)
  • Stefancich, M.  (autor)
  • Chiesa, Matteo  (autor)