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AFM as an alternative for Young's modulus determination in ceramic materials at elastic deformation regime

Autor
Roa, J.J.; Oncins, G.; Dias, F.T.; Vieira, V.N.; Schaf, J.; Segarra, M.
Tipus d'activitat
Article en revista
Revista
Physica C. Superconductivity and its applications
Data de publicació
2011-09-08
Volum
471
Número
17-18
Pàgina inicial
544
Pàgina final
548
DOI
https://doi.org/10.1016/j.physc.2011.05.249 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/17330 Obrir en finestra nova
Resum
A novel alternative to the conventional nanoindentation technique for hard materials is presented. An atomic force microscopy probe is used as an indenter, applying loads in the nN range and producing elastic deformations of a few nanometres. This new technique allows a reduction of the different inherent nanoindenter problems. This result in an increase in the quality of the overall results, and thus provide better understanding of the contact mechanism between the indenter and the sample, yiel...
Citació
Roa, J. [et al.]. AFM as an alternative for Young's modulus determination in ceramic materials at elastic deformation regime. "Physica C. Superconductivity and its applications", 08 Setembre 2011, vol. 471, núm. 17-18, p. 544-548.
Grup de recerca
CRnE - Centre de Recerca en Ciència i Enginyeria Multiescala de Barcelona

Participants

  • Roa Rovira, Joan Josep  (autor)
  • Oncins, Gerard  (autor)
  • Dias, Fábio Teixeira  (autor)
  • Vieira, Valdemar das Neves  (autor)
  • Schaf, Jacob  (autor)
  • Segarra Rubi, Merce  (autor)