Carregant...
Carregant...

Vés al contingut (premeu Retorn)

Raman scattering, microstructural and dielectric studies on Ba1-xCaxBi4Ti4O15 ceramics

Autor
Kumar, S.; Kundu, S.; Ochoa, D. A.; Garcia, J. E.; Varma, K.
Tipus d'activitat
Article en revista
Revista
Materials chemistry and physics
Data de publicació
2012-10
Volum
136
Número
2-3
Pàgina inicial
680
Pàgina final
687
DOI
https://doi.org/10.1016/j.matchemphys.2012.07.042 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/17246 Obrir en finestra nova
URL
http://www.sciencedirect.com/science/article/pii/S0254058412006906 Obrir en finestra nova
Resum
Polycrystalline powders of Ba1−xCaxBi4Ti4O15 (where x = 0, 0.25, 0.50, 0.75 and 1) were prepared via the conventional solid-state reaction route. X-ray diffraction (XRD) and Raman scattering techniques have been employed to probe into the structural changes on changing x. XRD analyses confirmed the formation of monophasic bismuth layered structure of all the above compositions with an increase in orthorhombic distortion with increase in x. Raman spectra revealed a redshift in A1g peak and an i...
Citació
Kumar, S. [et al.]. Raman scattering, microstructural and dielectric studies on Ba1-xCaxBi4Ti4O15 ceramics. "Materials chemistry and physics", Octubre 2012, vol. 136, núm. 2-3, p. 680-687.
Grup de recerca
CEMAD - Caracterització Elèctrica de Materials i Dispositius

Participants