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Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging

Autor
Santos, S.; Barcons, V.; Christenson, H.K.; Billingsley, D.J.; Bonass, W.A.; Font, J.; Thomson, N.
Tipus d'activitat
Article en revista
Revista
Applied physics letters
Data de publicació
2013
Volum
103
Número
6
Pàgina inicial
1
Pàgina final
4
DOI
https://doi.org/10.1063/1.4817906 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/20287 Obrir en finestra nova
URL
http://apl.aip.org/resource/1/applab/v103/i6/p063702_s1 Obrir en finestra nova
Resum
A way to operate fundamental mode amplitude modulation atomic force microscopy is introduced which optimizes stability and resolution for a given tip size and shows negligible tip wear over extended time periods ( 24 h). In small amplitude smal l set-point (SASS) imaging, the cantilever oscillates with sub-nanometer am plitudes in the proximity of the sample, without the requirement of using large drive forces, a s the dynamics smoothly lead the tip to the surface through the water layer. SASS i...
Citació
Santos , S. [et al.]. Stability, resolution, and ultra-low wear amplitude modulation atomic force microscopy of DNA: small amplitude small set-point imaging. "Applied physics letters", 2013, vol. 103, núm. 6, p. 1-4.
Paraules clau
Amplitude modulation Atomic force microscopy
Grup de recerca
CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
PERC-UPC - Centre de Recerca d'Electrònica de Potència UPC
SSR-UPC - Smart Sustainable Resources

Participants

  • Santos Hernandez, Sergio  (autor)
  • Barcons Xixons, Victor  (autor)
  • Christenson, Hugo K.  (autor)
  • Billingsley, Daniel J.  (autor)
  • Bonass, William A.  (autor)
  • Font Teixido, Jose  (autor)
  • Thomson, Neil H.  (autor)

Arxius