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A nanometric displacement measurement system using differential optical feedback interferometry

Autor
Azcona, F. J.; Atashkhooei, R.; Royo, S.; Mendez, J.; Jha, A.
Tipus d'activitat
Article en revista
Revista
IEEE photonics technology letters
Data de publicació
2013-11-01
Volum
25
Número
21
Pàgina inicial
2074
Pàgina final
2077
DOI
https://doi.org/10.1109/LPT.2013.2281269 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/21004 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6595025 Obrir en finestra nova
Resum
We propose differential optical feedback interferometry, a technique able to measure nanometer-size amplitude displacements by comparing the optical power of two lasers subject to optical feedback. In this letter, the principles of the technique are explained in detail, and its limits are explored by simulation. Theoretical results are presented showing that the technique can measure nanometer scale displacements with resolution within the angstrom scale. An experimental setup for validation has...
Citació
Azcona, F. [et al.]. A nanometric displacement measurement system using differential optical feedback interferometry. "IEEE photonics technology letters", 01 Novembre 2013, vol. 25, núm. 21, p. 2074-2077.
Paraules clau
Laser sensors, nanodisplacement sensing, optical feedback interferometry, optical metrology
Grup de recerca
CD6 - Centre de Desenvolupament de Sensors, Instrumentació i Sistemes
GREO - Grup de Recerca en Enginyeria Òptica

Participants

  • Azcona Guerrero, Francisco Javier  (autor)
  • Atashkhooei, Reza  (autor)
  • Royo Royo, Santiago  (autor)
  • Mendez Astudillo, Jorge  (autor)
  • Jha, Ajit  (autor)