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Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions

Autor
Santos, S.
Tipus d'activitat
Article en revista
Revista
Applied physics letters
Data de publicació
2013-12-02
Volum
103
Número
23
Pàgina inicial
231603-1
Pàgina final
231603-5
DOI
https://doi.org/10.1063/1.4840075 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/21802 Obrir en finestra nova
URL
http://scitation.aip.org/content/aip/journal/apl/103/23/10.1063/1.4840075 Obrir en finestra nova
Resum
Here, we introduce bimodal atomic force microscopy operated with sub-nm and ultra-small, i.e., sub-angstrom, first and second mode amplitudes in ambient conditions. We show how the tip can be made to oscillate in the proximity of the surface and in perpetual contact with the adsorbed water layers while the second mode amplitude and phase provide enhanced contrast and sensitivity. Nonlinear and nonmonotonic behavior of the experimental observables is discussed theoretically with a view to high re...
Citació
Santos, S. Enhanced sensitivity and contrast with bimodal atomic force microscopy with small and ultra-small amplitudes in ambient conditions. "Applied physics letters", 02 Desembre 2013, vol. 103, núm. 23, p. 231603-1-231603-5.
Paraules clau
Sample Interaction Regimes, Modulation Afm, Mode, Spectroscopy, Resolution, Surface, Energy

Participants

  • Santos Hernandez, Sergio  (autor)

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