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Radio-Frequency Performance of Carbon Nanotube-Based Devices and Circuits Considering Noise and Process Variation

Autor
Landauer, G.M.; Gonzalez, J.
Tipus d'activitat
Article en revista
Revista
IEEE transactions on nanotechnology
Data de publicació
2014-03-01
Volum
13
Número
2
Pàgina inicial
228
Pàgina final
237
DOI
https://doi.org/10.1109/TNANO.2014.2298094 Obrir en finestra nova
Projecte finançador
Design And Test Principles For Terascale Integrated Systems
PRINCIPIOS DE DISEÑO Y TEST DE SISTEMAS INTEGRADOS EN TERA-ESCALA
Repositori
http://hdl.handle.net/2117/27906 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?tp=&arnumber=6702460 Obrir en finestra nova
Resum
This paper provides a global overview of the radiofrequency (RF) performance potential of carbon-nanotube field-effect transistors (CNFET), which for the first time includes the impact of noise. We develop noise and manufacturing process variability extensions for the Stanford CNFET compact model, implemented in Verilog-A and compatible with conventional circuit simulators. CNFET figures-of-merit (FoM) are determined both on the device and on the circuit level. Compared to silicon technology, CN...
Citació
Landauer, G.M.; Gonzalez, J.L. Radio-Frequency Performance of Carbon Nanotube-Based Devices and Circuits Considering Noise and Process Variation. "IEEE transactions on nanotechnology", 01 Març 2014, vol. 13, núm. 2, p. 228-237.
Paraules clau
CMOS TECHNOLOGY, COMPACT SPICE MODEL, Carbon nanotube (CNT), ELECTRONICS, FETS, FIELD-EFFECT TRANSISTORS, INCLUDING NONIDEALITIES, PART II, VCO, carbon-nanotube field-effect transistor (CNFET), noise model, performance benchmarking, process variability, radio frequency (RF)
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

Participants

  • Landauer, Gerhard Martin  (autor)
  • Gonzalez Jimenez, Jose Luis  (autor)