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Microscale spatially resolved characterization of highly doped regions in laser-fired contacts for high-efficiency crystalline Si solar cells

Autor
Roige, A.; Alvarez, J.; Kleider, J.; Martin, I.; Alcubilla, R.; Vega, L.
Tipus d'activitat
Article en revista
Revista
IEEE journal of photovoltaics
Data de publicació
2015-03-01
Volum
5
Número
2
Pàgina inicial
545
Pàgina final
551
DOI
https://doi.org/10.1109/JPHOTOV.2015.2392945 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/81832 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7031869 Obrir en finestra nova
Resum
Laser-fired contact (LFC) processes have emerged as a promising approach to create rear local electric contacts in p-type crystalline silicon solar cells. Although this approach has been successfully applied in devices showing efficiencies above 20%, there is still a lack of knowledge about some specific features of LFCs at the submicron level. In this study, we used micro-Raman and microphotoluminescence (PL) spectroscopies to carry out a high-resolution spatially resolved characterization of L...
Citació
Roige, A., Alvarez, J., Kleider, J., Martin, I., Alcubilla, R., Vega, L. Microscale spatially resolved characterization of highly doped regions in laser-fired contacts for high-efficiency crystalline Si solar cells. "IEEE Journal of Photovoltaics", 01 Març 2015, vol. 5, núm. 2, p. 545-551.
Paraules clau
Crystalline silicon, Laser-fired contacts (LFCs), Micro-Raman spectroscopy, Microphotoluminescence spectroscopy
Grup de recerca
MNT - Grup de Recerca en Micro i Nanotecnologies

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