A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 /spl Theta/ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.
Lazaro, A., Pradell, L. Extraction of noise parameters of transistor using a spectrum analyser and 50 /spl Theta/ noise figure measurements only. "Electronics Letters", Novembre 1998, vol. 34, núm. 24, p. 2353-2354.