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Extraction of noise parameters of transistor using a spectrum analyser and 50 /spl Theta/ noise figure measurements only

Autor
Lazaro, A.; Pradell, L.
Tipus d'activitat
Article en revista
Revista
Electronics Letters
Data de publicació
1998-11
Volum
34
Número
24
Pàgina inicial
2353
Pàgina final
2354
DOI
https://doi.org/10.1049/el:19981592 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/98027 Obrir en finestra nova
URL
http://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/document/743045/ Obrir en finestra nova
Resum
A method for measuring the four noise parameters of a transistor in the microwave range using a configuration based on a conventional spectrum analyser is presented. In contrast to previous methods, it requires wideband 50 /spl Theta/ noise-figure measurements only. The method features an accuracy similar to that of noise figure meters at a much higher measurement speed and lower cost.
Citació
Lazaro, A., Pradell, L. Extraction of noise parameters of transistor using a spectrum analyser and 50 /spl Theta/ noise figure measurements only. "Electronics Letters", Novembre 1998, vol. 34, núm. 24, p. 2353-2354.
Paraules clau
Electric noise measurement
Grup de recerca
RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones

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