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A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes

Autor
Maya, M.; Lázaro, A.; De Paco, P.; Pradell, L.
Tipus d'activitat
Article en revista
Revista
Microwave and optical technology letters
Data de publicació
2003-12
Volum
39
Número
5
Pàgina inicial
373
Pàgina final
378
URL
http://hdl.handle.net/2117/1119 Obrir en finestra nova
Resum
This paper presents a method for characterizing coplanar waveguide-to-microstrip (CPW-M) transitions by using on-wafer coplanar (CPW) microprobes. It is based on extracting the transmission matrix of the CPW-M transition from the measurement of the S parameters of two microstrip transmission lines of different lengths, each of which includes two CPW-M transitions. To verify the proposed method, the S parameters of a zero-length line, which is composed of two CPW-M transitions (thru connection) a...
Citació
Maya, M. C.; Lázaro, A.; De Paco, P.; Pradell, L. A method for characterizing coplanar waveguide-to-microstrip transitions, and its application to the measurement of microstrip devices with coplanar microprobes. Microwave and optical technology letters, 2003 , vol. 39, núm. 5, p. 373-378.
Grup de recerca
RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones

Participants

  • Maya, M C  (autor)
  • Lázaro Guillen, Antoni  (autor)
  • de Paco Sánchez, Pedro Antonio  (autor)
  • Pradell Cara, Lluis  (autor)