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Accuracy considerations in microstrip surface impedance measurements

Autor
O'callaghan, J.; Sans, C.; Collado, J.; Canet, E.; Pous, R.; Fontcuberta, J.
Tipus d'activitat
Article en revista
Revista
IEEE transactions on applied superconductivity
Data de publicació
1997-06
Volum
7
Número
2
Pàgina inicial
1869
Pàgina final
1872
DOI
https://doi.org/10.1109/77.620949 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/992 Obrir en finestra nova
URL
http://ieeexplore.ieee.org.recursos.biblioteca.upc.edu/document/620949/ Obrir en finestra nova
Resum
An approach is proposed for the design, measurement and data extraction of superconducting microstrip resonators used in determination of surface resistance and penetration depth. Major sources of error are analyzed and procedures to minimize them are given An approach is proposied for the design, measurement and data extraction of superconducting microstrip resonators used in determination of surface resistance and penetration depth. Major sources of error are analyzed and procedures to minimiz...
Citació
O'Callaghan, J.; Sans, C; Collado, C; Canet, E; Pous, R; Fontcuberta, J. Accuracy considerations in microstrip surface impedance measurements. IEEE Transactions on applied superconductivity, 1997, vol. 7, núm 2, p. 1869-1872.
Paraules clau
Electric impedance measurement, Measurement errors, Microstrip resonators, Microwave measurement, Penetration depth (superconductivity), Superconducting cavity resonators, Superconducting device testing
Grup de recerca
CSC - Components and Systems for Communications Research Group
RF&MW - Grup de Recerca de sistemes, dispositius i materials de RF i microones

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