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Reliability: fallacy or reality?

Autor
Gonzalez, A.; Mahlke, S.; Mukherjee, S.; Sendag, R.; Chiou, D.; Yi, J.
Tipus d'activitat
Article en revista
Revista
IEEE micro
Data de publicació
2007-11
Volum
27
Número
6
Pàgina inicial
36
Pàgina final
45
DOI
https://doi.org/10.1109/MM.2007.107 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/102015 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/document/4437718/ Obrir en finestra nova
Resum
As chip architects and manufacturers plumb ever-smaller process technologies, new species of faults are compromising device reliability, following an introduction by the authors debate whether reliability is a legitimate concern for the microarchitect. topics include the costs of adding reliability versus those of ignoring it, how to measure it, techniques for improving it, and whether consumers really want it.
Citació
González, A., Mahlke, S., Mukherjee, S., Sendag, R., Chiou, D., Yi, J. Reliability: fallacy or reality?. "IEEE micro", Novembre 2007, vol. 27, núm. 6, p. 36-45.
Grup de recerca
ARCO - Microarquitectura i Compiladors

Participants

  • Gonzalez Colas, Antonio Maria  (autor)
  • Mahlke, Scott  (autor)
  • Mukherjee, Shubu  (autor)
  • Sendag, Resit  (autor)
  • Chiou, Derek  (autor)
  • Yi, Joshua J.  (autor)

Arxius