Carregant...
Carregant...

Vés al contingut (premeu Retorn)

DC temperature measurements to characterize the central frequency and 3 dB bandwidth in mmW power amplifiers

Autor
Aragones, X.; Mateo, D.; Gonzalez, J.; Vidal, E.; Gómez, D.; Martineau, B.; Altet, J.
Tipus d'activitat
Article en revista
Revista
IEEE microwave and wireless components letters
Data de publicació
2015-11
Volum
25
Número
11
Pàgina inicial
745
Pàgina final
747
DOI
https://doi.org/10.1109/LMWC.2015.2479848 Obrir en finestra nova
Projecte finançador
TEC2013-45638-C3-2-R - APROXIMACION MULTINIVEL AL DISEÑO ORIENTADO A LA FIABILIDAD DE CIRCUITOS INTEGRADOS ANALOGICOS Y DIGITALES
Repositori
http://hdl.handle.net/2117/79249 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7293238&filter%3DAND%28p_IS_Number%3A7317830%29 Obrir en finestra nova
Resum
This letter shows how a temperature sensor and a simple DC voltage multimeter can be used as instruments to determine the central frequency and 3 dB bandwidth of a 60 GHz linear power amplifier (PA). Compared to previous works, the DC temperature monitoring now proposed requires a much simpler and convenient measurement set-up. In this example, the temperature sensor is embedded in the same silicon die as the PA. Being placed in empty layout spaces next to it, it is proposed as a built-in test c...
Citació
Aragones, X., Mateo, D., González, J.L., Vidal, E., Gómez, D., Martineau, B., Altet, J. DC temperature measurements to characterize the central frequency and 3 dB bandwidth in mmW power amplifiers. "IEEE microwave and wireless components letters", Novembre 2015, vol. 25, núm. 11, p. 745-747.
Paraules clau
Built-in test, CMOS millimeter wave integrated circuits, Design for testability, Temperature measurement
Grup de recerca
EPIC - Energy Processing and Integrated Circuits
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
PERC-UPC - Centre de Recerca d'Electrònica de Potència UPC

Participants