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Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme

Autor
Pouyan, P.; Amat, E.; Rubio, A.
Tipus d'activitat
Presentació treball a congrés
Nom de l'edició
22nd European Conference on Circuit Theory and Design
Any de l'edició
2015
Data de presentació
2015-08-25
Llibre d'actes
2015 European Conference on Circuit Theory and Design (ECCTD): August 24-26, 2015: Trondheim, Norway
Editor
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/ECCTD.2015.7300125 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/81560 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/search/searchresult.jsp?queryText=ECCTD%202015%20rubio&newsearch=true Obrir en finestra nova
Resum
One of the most promising emerging technologies is based on the use of memristive devices. Although capable of implementing certain type of logic circuits, they are being extensively used for memory applications. Beside memristor advantages such as high scalability, their drawbacks including manufacturing process variability and limited read/write endurance, could risk their future utilization. In this work we propose an implementation of a proactive reconfiguration strategy alongside a testing ...
Citació
Pouyan, P., Amat, E., Rubio, A. Memristive crossbar design and test in non-adaptive proactive reconfiguring scheme. A: European Conference on Circuit Theory and Design. "2015 European Conference on Circuit Theory and Design (ECCTD): August 24-26, 2015: Trondheim, Norway". Trondheim: Institute of Electrical and Electronics Engineers (IEEE), 2015.
Paraules clau
Crossbar, Rram, Emerging Device, Memristor, Proactive Reconfiguration, Process Variability, Reliability, Test
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

Participants