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  • Backside polishing detector: a new protection against backside attacks  Open access

     Manich, S.; Arumi, D.; Rodriguez, R.; Mujal, J.; Hernandez, D.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2015-11-25
    Presentation of work at congresses
    Access to the full text
  • Prebond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. PP, num. 99, p. 31-36
    DOI: 10.1109/TVLSI.2015.2448594
    Date of publication: 2015-08-07
    Journal article
  • Ensenyament basat en projectes en els nous graus d'enginyeria a l'ETSEIB: Projecte 1 i Projecte 2

     Alquezar, O.; Angulo, C.; Boix, O.; Buj, I.; Calvo, J.; Cardona, S.; Cortina, J.; Garcia-Planas, M.I.; Grima, P.; Jordi, L.; Lusa, A.; Martinez, M.; Mateo, M.; Morancho, J.; Moreno, M.; Rodero, L.; Rodriguez, R.; Solano, L.; Tost, D.; Vilaplana, J.
    Jornada de Docència a l'ETSEIB
    Presentation's date: 2015-07-13
    Presentation of work at congresses
  • Read/write robustness estimation metrics for spin transfer torque (STT) MRAM cell

     Vatajelu, E.; Rodriguez, R.; Indaco, M.; Renovell, M.; Paolo Prinetto; Figueras, J.
    Design, Automation & Test in Europe Conference & Exhibition
    p. 447-452
    Presentation of work at congresses
  • STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations

     Vatajelu, E.; Rodriguez, R.; Indaco, M.; Paolo Prinetto; Figueras, J.
    International Conference on Design & Technology of Integrated Systems in Nanoscale Era
    p. 1-6
    DOI: 10.1109/DTIS.2015.7127377
    Presentation of work at congresses
  • Power-aware voltage tuning for STT-MRAM reliability

     Vatajelu, E.; Rodriguez, R.; Stefano Di Carlo; Renovell, M.; Paolo Prinetto; Figueras, J.
    IEEE European Test Symposium
    p. 1-6
    DOI: 10.1109/ETS.2015.7138748
    Presentation of work at congresses
  • Resistive open defect characteritzation in 3D 6T SRAM memories

     Castillo, R.; Arumi, D.; Rodriguez, R.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-26
    Presentation of work at congresses
  • Electrical localisation of full open defects in comb-meander-comb structures

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Electronics Letters
    Vol. 50, num. 23, p. 1682-1683
    DOI: 10.1049/el.2014.3104
    Date of publication: 2014-11-06
    Journal article
  • Pre-bond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE International On-Line Testing Symposium
    p. 31-36
    DOI: 10.1109/IOLTS.2014.6873668
    Presentation's date: 2014-07-07
    Presentation of work at congresses
  • Post-Bond test of through-silicon vias with open defects

     Rodriguez, R.; Arumi, D.; Figueras, J.
    IEEE European Test Symposium
    p. 1-6
    DOI: 10.1109/ETS.2014.6847816
    Presentation's date: 2014-05-29
    Presentation of work at congresses
  • Análisis y técnicas de mejora de la robustez y seguridad de circuitos nanométricos en presencia de ataques, defectos, variabilidad y Aging

     Balado, L.; Rius, J.; Manich, S.; Lamaison, R.; Renovell, M.; Lupon, E.; Arumi, D.; Rodriguez, R.
    Competitive project
  • Reliability estimation at block-level granularity of spin-transfer-torque MRAMs

     Stefano Di Carlo; Indaco, M.; Paolo Prinetto; Vatajelu, E. I.; Rodriguez, R.; Figueras, J.
    IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
    p. 75-80
    DOI: 10.1109/DFT.2014.6962093
    Presentation's date: 2014
    Presentation of work at congresses
  • Backside polishing detector

     Manich, S.; Arumi, D.; Rodriguez, R.; Sigl, G.; Mujal, J.
    Workshop on Secure Hardware and Security Evaluation
    Presentation's date: 2013-12-13
    Presentation of work at congresses
  • Una propuesta de evaluación de competencias genéricas en grados de Ingeniería  Open access

     Martinez, M.; Amante, B.; Cadenato, A.; Rodriguez, R.
    Red U: revista de docencia universitaria (online)
    Vol. 11, num. extraordinario, p. 111-139
    Date of publication: 2013-10-01
    Journal article
    Access to the full text
  • Diagnosis of interconnect full open defects in the presence of gate leakage currents

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 32, num. 2, p. 301-312
    DOI: 10.1109/TCAD.2012.2228269
    Date of publication: 2013-02
    Journal article
  • BIST Architecture to Detect Defects in TSVs During Pre-Bond Testing

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE European Test Symposium
    DOI: 10.1109/ETS.2013.6569389
    Presentation of work at congresses
  • Adaptive self test of defective TSVs

     Rodriguez, R.; Arumi, D.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2012-11-30
    Presentation of work at congresses
  • Circuito de autotest integrado de TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date of request: 2012-10-09
    Invention patent
  • Shape-shifting digital hardware concept: towards a new adaptive computing system

     Rubio, A.; Garcia, C.; Martin, J.; Crespo, A.; Rodriguez, R.; Nafría, M.
    NASA/ESA Conference on Adaptive Hardware and Systems
    p. 167-173
    Presentation's date: 2012-07
    Presentation of work at congresses
  • Integració i avaluació de competències genèriques als Graus de l'ETSEIB

     Rodriguez, R.; Aguilar Perez, Marta.
    Jornada d'Innovació Docent
    Presentation's date: 2012-02-07
    Presentation of work at congresses
  • Integració i avaluació de competències genèriques als Graus de l'ETSEIB  Open access

     Rodriguez, R.; Aguilar Perez, Marta.
    Jornada d'Innovació Docent
    p. 1-10
    Presentation's date: 2012-02-07
    Presentation of work at congresses
    Access to the full text
  • Gate leakage impact on full open defects in interconnect lines  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. 19, num. 12, p. 2209-2220
    DOI: 10.1109/TVLSI.2010.2077315
    Date of publication: 2011-12
    Journal article
    Access to the full text
  • Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 30, num. 12, p. 1911-1922
    DOI: 10.1109/TCAD.2011.2165071
    Date of publication: 2011-12
    Journal article
  • 8T SRAM Cell with Open Defects under Voltage and Timing Variations  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Castillo, R.
    Conference on Design of Circuits and Integrated Systems
    p. 155-160
    Presentation's date: 2011-11-16
    Presentation of work at congresses
    Access to the full text
  • CLIL implementation at a Spanish university: A pilot experience

     Aguilar Perez, Marta.; Rodriguez, R.; Oriol, C.
    English for International and Intercultural Communication
    p. 31-32
    Presentation's date: 2011-06-03
    Presentation of work at congresses
  • Impacto de la variabilidad en las estrategias de test y diagnóstico de circuitos micro/nanoelectrónicos

     Balado, L.; Sanahuja, R.; Lupon, E.; Rius, J.; Rodriguez, R.; Manich, S.; Vatajelu, E.; Arumi, D.; Figueras, J.
    Competitive project
  • Lecturer and student perceptions on CLIL at a spanish university

     Aguilar Perez, Marta.; Rodriguez, R.
    International journal of bilingual education and bilingualism
    Vol. 15, num. 2-3, p. 183-197
    DOI: 10.1080/13670050.2011.615906
    Date of publication: 2011
    Journal article
  • Simulations of interconnect open faults

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date: 2010-11
    Report
  • Defective Behaviour of an 8T SRAM Cell with Open Defects

     Rodriguez, R.; Arumi, D.; Manich, S.; Figueras, J.; Stefano Di Carlo; Paolo Prinetto; Scionti, A.
    International Conference on Advances in System Testing and Validation Lifecycle
    p. 81-86
    DOI: 10.1109/VALID.2010.19
    Presentation's date: 2010-08-24
    Presentation of work at congresses
  • Diagnosis of full open defects in interconnect lines with fan-out  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE European Test Symposium
    p. 233-238
    Presentation's date: 2010-05-27
    Presentation of work at congresses
    Access to the full text
  • Localization and Electrical Characterization of Interconnect Open Defects  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Beverloo, W.; de Vries, D.; Eichenberger, S.; Volf, P.
    IEEE transactions on semiconductor manufacturing
    Vol. 23, num. 1, p. 65-76
    DOI: 10.1109/TSM.2009.2039187
    Date of publication: 2010-02
    Journal article
    Access to the full text
  • Open defects in nanometer technologies

     Figueras, J.; Rodriguez, R.; Arumi, D.
    DOI: 10.1007/978-90-481-3282-9
    Date of publication: 2009-11-01
    Book chapter
    Image
  • Models for Bridging Defects

     Renovell, M.; Azais, F.; Figueras, J.; Rodriguez, R.; Arumi, D.
    DOI: 10.1007/978-90-481-3282-9
    Date of publication: 2009-11-01
    Book chapter
    Image
  • Delay caused by resistive opens in interconnecting lines

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Integration. The VLSI journal
    Vol. 42, num. 3, p. 286-293
    Date of publication: 2009-06
    Journal article
  • HI2008-0041 Acción integrada de investigación científica y tecnológica entre España e Italia

     Arumi, D.; Rodriguez, R.; Figueras, J.; Manich, S.
    Competitive project
  • Qualitat en Electrònica: Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

     Figueras, J.; Carrasco, J.; Lupon, E.; Manich, S.; Rodriguez, R.; Rius, J.; Balado, L.; Ferre, A.; Suñe, V.; Arumi, D.; Sanahuja, R.
    Competitive project
  • Impact of Gate Leakage Currents on Full Open Defects in SRAM Cells

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2008-11-12
    Presentation of work at congresses
  • Time-dependent behaviour of full open defects in interconnecting lines

     Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    INTERNATIONAL TEST CONFERENCE
    p. 1-10
    Presentation's date: 2008-10-29
    Presentation of work at congresses
  • Enhancement of defect diagnosis based on the analysis of CMOS DUT behaviour  Open access

     Arumi, D.
    Department of Electronic Engineering, Universitat Politècnica de Catalunya
    Theses
  • VTS07 Best Paper Award

     Arumi, D.; Rodriguez, R.; Figueras, J.; Rodríguez-Montañés, R.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.
    Award or recognition
  • Experimental Characterization of CMOS Interconnect Open Defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 27, num. 1, p. 123-136
    Date of publication: 2008-01
    Journal article
  • Impact of Gate Tunnelling Leakage on CMOS Circuits with Full Open Defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2007-11-22
    Presentation of work at congresses
  • Impact of gate tunnelling leakage on CMOS circuits with full open defects  Open access  awarded activity

     Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    Electronics Letters
    Vol. 43, num. Issue 21, p. 1140-1141
    DOI: 10.1049/el:20072117
    Date of publication: 2007-10
    Journal article
    Access to the full text
  • TEC2007-66672 DIAGNOSTICO EN TECNOLOGIAS CMOS NANOMETRICAS: MEJORA DEL RENDIMIENTO

     Arumi, D.; Rodriguez, R.; Lupon, E.; Manich, S.; Rius, J.; Balado, L.
    Competitive project
  • Caracterización eléctrica de planos de tintas conductoras sobre tejidos: modelo y datos experimentales.

     Rius, J.; Palacín, M.; Casadevall, V.; Rodriguez, R.; Manich, S.; Ridao, M.
    Date: 2007-06
    Report
  • Process-variability aware delay fault testing of ·VT and weak-open defects

     Arumi, D.; Rodriguez, R.; Pineda, J.; Gronthoud, G.
    The Eighth IEEE European Test Workshop
    p. 85-90
    Presentation's date: 2007-05-27
    Presentation of work at congresses
  • Diagnosis of Bridging Defects Based On Current Signatures at Low Power Supply Voltages

     Rodriguez, R.; Arumi, D.; Figueras, J.; Einchenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.
    IEEE VLSI Test Symposium
    p. 145-150
    Presentation's date: 2007-05-07
    Presentation of work at congresses