Go to the content (press return)

Scientific and technological production

1 to 50 of 303 results
 
  • Best Paper Award Design of Circuits and Integrated Systems Conference (DCIS2015)

     Álvaro Gómez-Pau; Lupon, E.; Balado, L.; Figueras, J.
    Award or recognition
  • Diagnosis of parametric defects in dual axis IC accelerometers

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Microsystem technologies-Micro-and nanosystems-Information storage and processing
    Vol. 21, num. 9, p. 1855-1866
    DOI: 10.1007/s00542-014-2218-4
    Date of publication: 2015-09-01
    Journal article
  • Prebond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. PP, num. 99, p. 31-36
    DOI: 10.1109/TVLSI.2015.2448594
    Date of publication: 2015-08-07
    Journal article
  • Analog circuits testing using digitally coded indirect measurements

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    International Conference on Design & Technology of Integrated Systems in Nanoscale Era
    p. 57-62
    DOI: 10.1109/DTIS.2015.7127357
    Presentation of work at congresses
  • An efficient behavioral description frontend tool for mixed-mode SPICE simulation  Open access

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.; Chatterjee, A.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-28
    Presentation of work at congresses
    Access to the full text
  • Quality metrics for mixed-signal indirect testing  Open access

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-26
    Presentation of work at congresses
    Access to the full text
  • Electrical localisation of full open defects in comb-meander-comb structures

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Electronics Letters
    Vol. 50, num. 23, p. 1682-1683
    DOI: 10.1049/el.2014.3104
    Date of publication: 2014-11-06
    Journal article
  • Pre-bond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE International On-Line Testing Symposium
    p. 31-36
    DOI: 10.1109/IOLTS.2014.6873668
    Presentation's date: 2014-07-07
    Presentation of work at congresses
  • Criteria for indirect measurements in M-S testing

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Workshop on Statistical Test Methods
    p. 1-6
    Presentation's date: 2014-05-30
    Presentation of work at congresses
  • Post-Bond test of through-silicon vias with open defects

     Rodriguez, R.; Arumi, D.; Figueras, J.
    IEEE European Test Symposium
    p. 1-6
    DOI: 10.1109/ETS.2014.6847816
    Presentation's date: 2014-05-29
    Presentation of work at congresses
  • M-S specification binning based on digitally coded indirect measurements

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    IEEE European Test Symposium
    p. 105-110
    Presentation's date: 2014-05-28
    Presentation of work at congresses
  • Best Paper Award in Design of Circuits and Integrated Systems Conference (DCIS2014)

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Award or recognition
  • Reliability estimation at block-level granularity of spin-transfer-torque MRAMs

     Stefano Di Carlo; Indaco, M.; Paolo Prinetto; Vatajelu, E. I.; Rodriguez, R.; Figueras, J.
    IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems
    p. 75-80
    DOI: 10.1109/DFT.2014.6962093
    Presentation's date: 2014
    Presentation of work at congresses
  • SRAM cell stability metric under transient voltage noise

     Vatajelu, E. I.; Álvaro Gómez-Pau; Renovell, M.; Figueras, J.
    Microelectronics journal
    Vol. 45, num. 10, p. 1348-1353
    DOI: 10.1016/j.mejo.2013.11.005
    Date of publication: 2013-12-20
    Journal article
  • Test of dual axis accelerometers based on specifications compliance  Open access

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2013-11-28
    Presentation of work at congresses
    Access to the full text
  • M-S test based on specification validation using octrees in the measure space

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    IEEE European Test Symposium
    p. 70-75
    DOI: 10.1109/ETS.2013.6569359
    Presentation's date: 2013-05-28
    Presentation of work at congresses
  • Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Design, Test, Integration & Packaging of MEMS/MOEMS
    Presentation's date: 2013-04-18
    Presentation of work at congresses
  • Diagnosis of interconnect full open defects in the presence of gate leakage currents

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 32, num. 2, p. 301-312
    DOI: 10.1109/TCAD.2012.2228269
    Date of publication: 2013-02
    Journal article
  • BIST Architecture to Detect Defects in TSVs During Pre-Bond Testing

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE European Test Symposium
    DOI: 10.1109/ETS.2013.6569389
    Presentation of work at congresses
  • SRAM stability metric under transient noise  Open access

     Álvaro Gómez-Pau; Renovell, M.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2012-11-30
    Presentation of work at congresses
    Access to the full text
  • Adaptive self test of defective TSVs

     Rodriguez, R.; Arumi, D.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2012-11-30
    Presentation of work at congresses
  • Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.  Open access

     Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    p. 223-228
    Presentation's date: 2012-11-28
    Presentation of work at congresses
    Access to the full text
  • Circuito de autotest integrado de TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date of request: 2012-10-09
    Invention patent
  • Process variability in sub-16nm bulk CMOS technology  Open access

     Rubio, A.; Figueras, J.; Vatajelu, E.; Canal, R.
    Date: 2012-03-01
    Report
    Access to the full text
  • Efficiency evaluation of parametric failure mitigation techniques for reliable SRAM operation

     Figueras, J.; Vatajelu, E. I.
    Design, Automation and Test in Europe
    p. 1343-1348
    Presentation's date: 2012
    Presentation of work at congresses
  • Gate leakage impact on full open defects in interconnect lines  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. 19, num. 12, p. 2209-2220
    DOI: 10.1109/TVLSI.2010.2077315
    Date of publication: 2011-12
    Journal article
    Access to the full text
  • Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 30, num. 12, p. 1911-1922
    DOI: 10.1109/TCAD.2011.2165071
    Date of publication: 2011-12
    Journal article
  • Testing dual axis IC accelerometers using Lissajous compositions

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    p. 1-4
    Presentation's date: 2011-11-17
    Presentation of work at congresses
  • 8T SRAM Cell with Open Defects under Voltage and Timing Variations  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Castillo, R.
    Conference on Design of Circuits and Integrated Systems
    p. 155-160
    Presentation's date: 2011-11-16
    Presentation of work at congresses
    Access to the full text
  • ROBUSTNESS ANALYSIS OF NANOMETRIC SRAM MEMORIES

     Vatajelu, E.
    Department of Electronic Engineering, Universitat Politècnica de Catalunya
    Theses
  • Testing IC accelerometers using Lissajous compositions

     Álvaro Gómez-Pau; Balado, L.; Figueras, J.
    Perspective Technologies and Methods in MEMS Design
    p. 75-81
    Presentation's date: 2011-05-11
    Presentation of work at congresses
  • New reliability mechanisms in memory design for sub-22nm technologies

     Aymerich, N.; Brown, A.; Canal, R.; Cheng, B.; Figueras, J.; Gonzalez, A.; Herrero, E.; Markov, S.; Miranda, M.; Pouyan, P.; Ramirez, T.; Rubio, A.; Vatajelu, I.; Vera, X.; Wang, W.; Zuber, P.; ASenov, A.
    IEEE International On-Line Testing Symposium
    p. 111-114
    DOI: 10.1109/IOLTS.2011.5993820
    Presentation of work at congresses
  • Impacto de la variabilidad en las estrategias de test y diagnóstico de circuitos micro/nanoelectrónicos

     Balado, L.; Sanahuja, R.; Lupon, E.; Rius, J.; Rodriguez, R.; Manich, S.; Vatajelu, E.; Arumi, D.; Figueras, J.
    Competitive project
  • Transient noise failures in SRAM cells : dynamic noise margin metric

     Álvaro Gómez-Pau; Renovell, M.; Figueras, J.; Vatajelu, E. I.
    Asian Test Symposium
    p. 413-418
    DOI: 10.1109/ATS.2011.64
    Presentation's date: 2011
    Presentation of work at congresses
  • Identification of component deviations in analog circuits using digital signatures

     Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    p. 187-192
    Presentation's date: 2010-11-17
    Presentation of work at congresses
  • Simulations of interconnect open faults

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date: 2010-11
    Report
  • Defective Behaviour of an 8T SRAM Cell with Open Defects

     Rodriguez, R.; Arumi, D.; Manich, S.; Figueras, J.; Stefano Di Carlo; Paolo Prinetto; Scionti, A.
    International Conference on Advances in System Testing and Validation Lifecycle
    p. 81-86
    DOI: 10.1109/VALID.2010.19
    Presentation's date: 2010-08-24
    Presentation of work at congresses
  • Statistical analysis of SRAM parametric failure under supply voltage scaling

     Vatajelu, E.; Figueras, J.
    IEEE-TTTC International Conference on Automation, Quality and Testing, Robotics
    p. 1-6
    DOI: 10.1109/AQTR.2010.5520825
    Presentation's date: 2010-05-29
    Presentation of work at congresses
  • Robustness of SRAM to Power Supply Noise during Leakage Power Saving in DVS

     Vatajelu, E.; Renovell, M.; Figueras, J.
    International Workshop on the Impact of Low Power design on Test and Reliability(LPonTR)
    p. 1-3
    Presentation's date: 2010-05-27
    Presentation of work at congresses
  • Diagnosis of full open defects in interconnect lines with fan-out  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE European Test Symposium
    p. 233-238
    Presentation's date: 2010-05-27
    Presentation of work at congresses
    Access to the full text
  • Parametric Failure Analysis of Embedded SRAMs using Fast & Accurate Dynamic Analysis

     Vatajelu, E.; Panagopoulos, G.; Roy, K.; Figueras, J.
    IEEE European Test Symposium
    p. 69-74
    Presentation's date: 2010-05-24
    Presentation of work at congresses
  • Analog circuit test based on a digital signature  Open access

     Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
    Design, Automation and Test in Europe
    p. 1641-1644
    Presentation's date: 2010-03-08
    Presentation of work at congresses
    Access to the full text
  • Built-In Sensor for Signal Integrity Faults in Digital Interconnect Signals  Open access

     Champac, V.; Avendaño, V.; Figueras, J.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. 18, num. 2, p. 256-269
    DOI: 10.1109/TVLSI.2008.2010398
    Date of publication: 2010-02
    Journal article
    Access to the full text
  • Localization and Electrical Characterization of Interconnect Open Defects  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Beverloo, W.; de Vries, D.; Eichenberger, S.; Volf, P.
    IEEE transactions on semiconductor manufacturing
    Vol. 23, num. 1, p. 65-76
    DOI: 10.1109/TSM.2009.2039187
    Date of publication: 2010-02
    Journal article
    Access to the full text
  • TERASCALE RELIABLE ADAPTIVE MEMORY SYSTEMS

     Moll, F.; Figueras, J.; Calomarde, A.; Aymerich, N.; Vatajelu, E.; Garcia, C.; Canal, R.; Pouyan, P.; Rubio, A.
    Competitive project
  • Verifying analog circuits based on a digital signature  Open access

     Álvaro Gómez-Pau; Sanahuja, R.; Balado, L.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2009-11-18
    Presentation of work at congresses
    Access to the full text
  • Diagnosis of Full Open Defects in Interconnect Lines with Large Fan-out

     Arumi, D.; Rodríguez-Montañés, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2009-11-18
    Presentation of work at congresses