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Scientific and technological production

1 to 50 of 109 results
 
  • Improving security in cache memory by power efficient scrambling technique

     Neagu, Madalin; Miclea, Liviu; Manich Bou, Salvador
    IET computers and digital techniques
    p. 1-10
    DOI: 10.1049/iet-cdt.2014.0030
    Date of publication: 2015-04-08
    Journal article
  • On the use of error detecting and correcting codes to boost security in caches against side channel attacks  Open access

     Neagu, Madalin; Miclea, Liviu; Manich Bou, Salvador
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    p. 1-6
    Presentation's date: 2015-03-13
    Presentation of work at congresses
    Access to the full text
  • Defeating microprobing attacks using a resource efficient detection circuit  Open access

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-27
    Presentation of work at congresses
    Access to the full text
  • A low area probing detector for power efficient security ICs

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    International Workshop on RFID Security
    p. 185-197
    Presentation's date: 2014-07-22
    Presentation of work at congresses
  • A low area probing detector for security IC's

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    p. 1-6
    Presentation's date: 2014-05-30
    Presentation of work at congresses
  • Interleaved scrambling technique: A novel low-power security layer for cache memories

     Neagu, Madalin; Manich Bou, Salvador; Miclea, Liviu
    IEEE European Test Symposium
    p. 1-2
    DOI: 10.1109/ETS.2014.6847844
    Presentation's date: 2014-05-29
    Presentation of work at congresses
  • Análisis y técnicas de mejora de la robustez y seguridad de circuitos nanométricos en presencia de ataques, defectos, variabilidad y aging

     Balado Suarez, Luz Maria; Rius Vázquez, Josep; Manich Bou, Salvador; Lamaison Urioste, Rafael Martin; Renovell, Michel; Lupon Roses, Emilio Jose; Rodríguez Montañés, Rosa
    Competitive project
  • Backside polishing detector

     Manich Bou, Salvador; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Sigl, Georg; Mujal, Jordi
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    Presentation's date: 2013-12-13
    Presentation of work at congresses
  • Information Leakage Reduction at the Scan-Path Output

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2013-11-28
    Presentation of work at congresses
  • Differential scan-path: A novel solution for secure design-for-testability

     Manich Bou, Salvador; Wamser, Markus S.; Guillen, Oscar M.; Sigl, Georg
    IEEE International Test Conference
    p. 1-9
    DOI: 10.1109/TEST.2013.6651902
    Presentation's date: 2013-09-11
    Presentation of work at congresses
  • A Highly time sensitive XOR gate for probe attempt detectors

     Manich Bou, Salvador; Strasser, Martin
    IEEE transactions on circuits and systems II: express briefs
    DOI: 10.1109/TCSII.2013.2278126
    Date of publication: 2013-09-05
    Journal article
  • Improving the security of scan path test using differential chains

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    Presentation's date: 2013-05-31
    Presentation of work at congresses
  • Detection of probing attempts in secure ICs

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    IEEE International Symposium on Hardware-Oriented Security and Trust
    p. 134-139
    DOI: 10.1109/HST.2012.6224333
    Presentation's date: 2012-06-05
    Presentation of work at congresses
  • DISPOSITIVO DE CONTROL DINÁMICO DE ILUMINACIÓN EN ESPACIOS CERRADOS PARA OPTIMIZAR Y REDUCIR EL CONSUMO ENERGÉTICO

     Manich Bou, Salvador; Caballero Díaz, Luis
    Date of request: 2011-06-29
    Invention patent
  • Impacto de la variabilidad en las estrategias de test y diagnóstico de circuitos micro/nanoelectrónicos

     Balado Suarez, Luz Maria; Sanahuja Moliner, Ricard; Lupon Roses, Emilio Jose; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Manich Bou, Salvador; Vatajelu, Elena Ioana; Arumi Delgado, Daniel; Figueras Pamies, Juan
    Competitive project
  • Defective Behaviour of an 8T SRAM Cell with Open Defects

     Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pamies, Juan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
    International Conference on Advances in System Testing and Validation Lifecycle
    p. 81-86
    DOI: 10.1109/VALID.2010.19
    Presentation's date: 2010-08-24
    Presentation of work at congresses
  • Design and implementation of automatic test equipment IP module

     Fransi Palos, Sergi; Farre Lozano, Goretti; García Deiros, Lucas; Manich Bou, Salvador
    IEEE European Test Symposium
    p. 244
    Presentation's date: 2010-05-25
    Presentation of work at congresses
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • HI2008-0041 Acción integrada de investigación científica y tecnológica entre España e Italia

     Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pamies, Juan; Manich Bou, Salvador
    Competitive project
  • Qualitat en Electrònica: Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

     Figueras Pamies, Juan; Carrasco Lopez, Juan Antonio; Lupon Roses, Emilio Jose; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Rius Vazquez, Jose; Balado Suarez, Luz Maria; Ferre Fabregas, Antoni; Suñe Socias, Victor Manuel; Arumi Delgado, Daniel; Sanahuja Moliner, Ricard
    Competitive project
  • Análisis de la respuesta de los sensores de presión textiles pes-0, pes-4 y pes-8

     Manich Bou, Salvador; Rius Casals, Juan-manuel; Casadevall, V; Ridao, M
    Date: 2008-04
    Report
  • PREMIS PFC CURS 2007-2008

     Manich Bou, Salvador
    Award or recognition
  • Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources

     Manich Bou, Salvador; Garcia-Deiros, L; Figueras Pamies, Juan
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 26, num. 11, p. 2046-2058
    Date of publication: 2007-11
    Journal article
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Computer. Aided design

     Manich Bou, Salvador
    Collaboration in journals
  • TEC2007-66672 DIAGNOSTICO EN TECNOLOGIAS CMOS NANOMETRICAS: MEJORA DEL RENDIMIENTO

     Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Lupon Roses, Emilio Jose; Manich Bou, Salvador; Rius Vazquez, Jose; Balado Suarez, Luz Maria
    Competitive project
  • IET computers and digital techniques

     Manich Bou, Salvador
    Collaboration in journals
  • Dispositivo de control de la tensión de polarización de un módulo electrónico funcional

     Figueras Pamies, Juan; Balado Suarez, Luz Maria; Manich Bou, Salvador; Ferre Fabregas, Antoni; Sanahuja Moliner, Ricard
    Date of request: 2007-07-30
    Invention patent
  • Caracterización de la respuesta estática del proceso de impresión de pistas conductoras por serigrafía en función de la anchura y espaciado entre líneas

     Rodríguez Montañés, Rosa; Casadevall, V; Rius Vazquez, Jose; Manich Bou, Salvador; Ridao Granado, Miguel
    Date: 2007-06
    Report
  • Caracterización eléctrica de planos de tintas conductoras sobre tejidos: modelo y datos experimentales.

     Rius Vazquez, Jose; Palacín, M; Casadevall, V; Rodríguez Montañés, Rosa; Manich Bou, Salvador; Ridao Granado, Miguel
    Date: 2007-06
    Report
  • Journal of electronic testing. Theory and applications

     Manich Bou, Salvador
    Collaboration in journals
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Journal of electronic testing. Theory and applications

     Manich Bou, Salvador
    Collaboration in journals
  • Journal of low power electronics

     Manich Bou, Salvador
    Collaboration in journals
  • Validación del ancho de banda de las líneas de transmissión textiles M133 a M137

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V; Ridao Granado, Miguel
    Date: 2007-02
    Report
  • Análisis de la sensibilidad y estabilidad de los teclados textiles M125, M127, M129, M131

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V; Ridao Granado, Miguel
    Date: 2007-02
    Report
  • Low cost estimation of leakage power consumption in large nanometric CMOS circuits

     Mendoza, R; Sanahuja Moliner, Ricard; Ferré, R; Manich Bou, Salvador; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    XXII Conference of Circuits and Integrated Systems
    Presentation of work at congresses
  • Electrical Characterization of Conductive Ink Layers on Textile Fabrics: Model and Experimental Results

     Rius Vazquez, Jose; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Ridao, Miquel
    XXII Conference of Circuits and Integrated Systems
    p. 1-6
    Presentation of work at congresses
  • Estudio de la Calidad y Estabilidad de las Tintas A, B y C como Medio de Alimentación Elèctrica de Circuitos Integrados

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V y M Ridao; Ridao Granado, Miguel
    Date: 2006-12
    Report
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Minimizing Test Time in Arithmetic Test Pattern Generators

     Manich Bou, Salvador; Garcia, Lucas; Figueras Pamies, Juan
    Date: 2006-06
    Report
  • Journal of low power electronics

     Manich Bou, Salvador
    Collaboration in journals