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Manich Bou, Salvador

Total activity: 110
Areas of expertise
Hardware Security of ICs, IC digital design, Low power digital design, Test of ICs
Professional category
University lecturer
Doctoral courses
Enginyer Industrial
University degree
Enginyer Industrial
Research group
CRNE - Centre for Research in Nanoengineering
QINE - Low Power Design, Test, Verification and Security ICs
Department
Department of Electronic Engineering
School
Barcelona School of Industrial Engineering (ETSEIB)
E-mail
salvador.manichupc.edu
Contact details
UPC directory Open in new window
Orcid
0000-0001-5265-1209 Open in new window

Scientific and technological production

1 to 50 of 110 results
 
  • Electronics. Electronics

     Manich Bou, Salvador
    Vol. 4, num. 4
    Collaboration in journals
  • Improving security in cache memory by power efficient scrambling technique

     Neagu, Madalin; Miclea, Liviu; Manich Bou, Salvador
    IET computers and digital techniques
    p. 1-10
    DOI: 10.1049/iet-cdt.2014.0030
    Date of publication: 2015-04-08
    Journal article
    Image
  • On the use of error detecting and correcting codes to boost security in caches against side channel attacks  Open access

     Neagu, Madalin; Miclea, Liviu; Manich Bou, Salvador
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    p. 1-6
    Presentation's date: 2015-03-13
    Presentation of work at congresses
    Access to the full text
  • Defeating microprobing attacks using a resource efficient detection circuit  Open access

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-27
    Presentation of work at congresses
    Access to the full text
  • A low area probing detector for power efficient security ICs

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    International Workshop on RFID Security
    p. 185-197
    Presentation's date: 2014-07-22
    Presentation of work at congresses
    Image
  • A low area probing detector for security IC's

     Weiner, Michael; Manich Bou, Salvador; Sigl, Georg
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    p. 1-6
    Presentation's date: 2014-05-30
    Presentation of work at congresses
    Image
  • Interleaved scrambling technique: A novel low-power security layer for cache memories

     Neagu, Madalin; Manich Bou, Salvador; Miclea, Liviu
    IEEE European Test Symposium
    p. 1-2
    DOI: 10.1109/ETS.2014.6847844
    Presentation's date: 2014-05-29
    Presentation of work at congresses
    Image
  • Análisis y técnicas de mejora de la robustez y seguridad de circuitos nanométricos en presencia de ataques, defectos, variabilidad y aging

     Balado Suarez, Luz Maria; Rius Vázquez, Josep; Manich Bou, Salvador; Lamaison Urioste, Rafael Martin; Renovell, Michel; Lupon Roses, Emilio Jose; Rodríguez Montañés, Rosa
    Competitive project
  • Backside polishing detector

     Manich Bou, Salvador; Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Sigl, Georg; Mujal, Jordi
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    Presentation's date: 2013-12-13
    Presentation of work at congresses
  • Information Leakage Reduction at the Scan-Path Output

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2013-11-28
    Presentation of work at congresses
    Image
  • Differential scan-path: A novel solution for secure design-for-testability

     Manich Bou, Salvador; Wamser, Markus S.; Guillen, Oscar M.; Sigl, Georg
    IEEE International Test Conference
    p. 1-9
    DOI: 10.1109/TEST.2013.6651902
    Presentation's date: 2013-09-11
    Presentation of work at congresses
    Image
  • A Highly time sensitive XOR gate for probe attempt detectors

     Manich Bou, Salvador; Strasser, Martin
    IEEE transactions on circuits and systems II: express briefs
    DOI: 10.1109/TCSII.2013.2278126
    Date of publication: 2013-09-05
    Journal article
    Image
  • Improving the security of scan path test using differential chains

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    Workshop on Trustworthy Manufacturing and Utilization of Secure Devices
    Presentation's date: 2013-05-31
    Presentation of work at congresses
    Image
  • Detection of probing attempts in secure ICs

     Manich Bou, Salvador; Wamser, Markus S.; Sigl, Georg
    IEEE International Symposium on Hardware-Oriented Security and Trust
    p. 134-139
    DOI: 10.1109/HST.2012.6224333
    Presentation's date: 2012-06-05
    Presentation of work at congresses
  • DISPOSITIVO DE CONTROL DINÁMICO DE ILUMINACIÓN EN ESPACIOS CERRADOS PARA OPTIMIZAR Y REDUCIR EL CONSUMO ENERGÉTICO

     Manich Bou, Salvador; Caballero Díaz, Luis
    Date of request: 2011-06-29
    Invention patent
  • Impacto de la variabilidad en las estrategias de test y diagnóstico de circuitos micro/nanoelectrónicos

     Balado Suarez, Luz Maria; Sanahuja Moliner, Ricard; Lupon Roses, Emilio Jose; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Manich Bou, Salvador; Vatajelu, Elena Ioana; Arumi Delgado, Daniel; Figueras Pamies, Juan
    Competitive project
  • Defective Behaviour of an 8T SRAM Cell with Open Defects

     Rodríguez Montañés, Rosa; Arumi Delgado, Daniel; Manich Bou, Salvador; Figueras Pamies, Juan; Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto
    International Conference on Advances in System Testing and Validation Lifecycle
    p. 81-86
    DOI: 10.1109/VALID.2010.19
    Presentation's date: 2010-08-24
    Presentation of work at congresses
    Image
  • Design and implementation of automatic test equipment IP module

     Fransi Palos, Sergi; Farre Lozano, Goretti; García Deiros, Lucas; Manich Bou, Salvador
    IEEE European Test Symposium
    p. 244
    Presentation's date: 2010-05-25
    Presentation of work at congresses
    Image
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Qualitat en Electrònica: Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

     Figueras Pamies, Juan; Carrasco Lopez, Juan Antonio; Lupon Roses, Emilio Jose; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Rius Vazquez, Jose; Balado Suarez, Luz Maria; Ferre Fabregas, Antoni; Suñe Socias, Victor Manuel; Arumi Delgado, Daniel; Sanahuja Moliner, Ricard
    Competitive project
  • HI2008-0041 Acción integrada de investigación científica y tecnológica entre España e Italia

     Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Figueras Pamies, Juan; Manich Bou, Salvador
    Competitive project
  • Análisis de la respuesta de los sensores de presión textiles pes-0, pes-4 y pes-8

     Manich Bou, Salvador; Rius Casals, Juan-manuel; Casadevall, V; Ridao, M
    Date: 2008-04
    Report
  • PREMIS PFC CURS 2007-2008

     Manich Bou, Salvador
    Award or recognition
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Minimizing Test Time in Arithmetic Test-Pattern Generators With Constrained Memory Resources

     Manich Bou, Salvador; Garcia-Deiros, L; Figueras Pamies, Juan
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 26, num. 11, p. 2046-2058
    Date of publication: 2007-11
    Journal article
  • TEC2007-66672 DIAGNOSTICO EN TECNOLOGIAS CMOS NANOMETRICAS: MEJORA DEL RENDIMIENTO

     Arumi Delgado, Daniel; Rodríguez Montañés, Rosa; Lupon Roses, Emilio Jose; Manich Bou, Salvador; Rius Vazquez, Jose; Balado Suarez, Luz Maria
    Competitive project
  • Computer. Aided design

     Manich Bou, Salvador
    Collaboration in journals
  • IET computers and digital techniques

     Manich Bou, Salvador
    Collaboration in journals
  • Dispositivo de control de la tensión de polarización de un módulo electrónico funcional

     Figueras Pamies, Juan; Balado Suarez, Luz Maria; Manich Bou, Salvador; Ferre Fabregas, Antoni; Sanahuja Moliner, Ricard
    Date of request: 2007-07-30
    Invention patent
  • Journal of electronic testing. Theory and applications

     Manich Bou, Salvador
    Collaboration in journals
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Caracterización de la respuesta estática del proceso de impresión de pistas conductoras por serigrafía en función de la anchura y espaciado entre líneas

     Rodríguez Montañés, Rosa; Casadevall, V; Rius Vazquez, Jose; Manich Bou, Salvador; Ridao Granado, Miguel
    Date: 2007-06
    Report
  • Caracterización eléctrica de planos de tintas conductoras sobre tejidos: modelo y datos experimentales.

     Rius Vazquez, Jose; Palacín, M; Casadevall, V; Rodríguez Montañés, Rosa; Manich Bou, Salvador; Ridao Granado, Miguel
    Date: 2007-06
    Report
  • Journal of electronic testing. Theory and applications

     Manich Bou, Salvador
    Collaboration in journals
  • Journal of low power electronics

     Manich Bou, Salvador
    Collaboration in journals
  • Validación del ancho de banda de las líneas de transmissión textiles M133 a M137

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V; Ridao Granado, Miguel
    Date: 2007-02
    Report
  • Análisis de la sensibilidad y estabilidad de los teclados textiles M125, M127, M129, M131

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V; Ridao Granado, Miguel
    Date: 2007-02
    Report
  • Low cost estimation of leakage power consumption in large nanometric CMOS circuits

     Mendoza, R; Sanahuja Moliner, Ricard; Ferré, R; Manich Bou, Salvador; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    XXII Conference of Circuits and Integrated Systems
    Presentation of work at congresses
  • Electrical Characterization of Conductive Ink Layers on Textile Fabrics: Model and Experimental Results

     Rius Vazquez, Jose; Manich Bou, Salvador; Rodríguez Montañés, Rosa; Ridao, Miquel
    XXII Conference of Circuits and Integrated Systems
    p. 1-6
    Presentation of work at congresses
  • Estudio de la Calidad y Estabilidad de las Tintas A, B y C como Medio de Alimentación Elèctrica de Circuitos Integrados

     Manich Bou, Salvador; Rius Vazquez, Jose; Rodríguez Montañés, Rosa; Casadevall, V y M Ridao; Ridao Granado, Miguel
    Date: 2006-12
    Report
  • IEEE transactions on circuits and systems II: express briefs

     Manich Bou, Salvador
    Collaboration in journals
  • Minimizing Test Time in Arithmetic Test Pattern Generators

     Manich Bou, Salvador; Garcia, Lucas; Figueras Pamies, Juan
    Date: 2006-06
    Report
  • Journal of low power electronics

     Manich Bou, Salvador
    Collaboration in journals