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  • On the use of RRAM cells to design physical unclonable functions

     Arumi, D.
    NanoVar Scientific Workshop
    Presentation's date: 2016-02-02
    Presentation of work at congresses
  • Backside polishing detector: a new protection against backside attacks  Open access

     Manich, S.; Arumi, D.; Rodriguez, R.; Mujal, J.; Hernandez, D.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2015-11-25
    Presentation of work at congresses
    Access to the full text
  • Test escapes of stuck-open faults caused by parasitic capacitances and leakage currents  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. 24, num. 5, p. 1739-1748
    DOI: 10.1109/TVLSI.2015.2477103
    Date of publication: 2015-09-24
    Journal article
    Access to the full text
  • Prebond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. PP, num. 99, p. 31-36
    DOI: 10.1109/TVLSI.2015.2448594
    Date of publication: 2015-08-07
    Journal article
  • Resistive open defect characteritzation in 3D 6T SRAM memories

     Castillo, R.; Arumi, D.; Rodriguez, R.
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-26
    Presentation of work at congresses
  • Electrical localisation of full open defects in comb-meander-comb structures

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Electronics Letters
    Vol. 50, num. 23, p. 1682-1683
    DOI: 10.1049/el.2014.3104
    Date of publication: 2014-11-06
    Journal article
  • Pre-bond testing of weak defects in TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE International On-Line Testing Symposium
    p. 31-36
    DOI: 10.1109/IOLTS.2014.6873668
    Presentation's date: 2014-07-07
    Presentation of work at congresses
  • Post-Bond test of through-silicon vias with open defects

     Rodriguez, R.; Arumi, D.; Figueras, J.
    IEEE European Test Symposium
    p. 1-6
    DOI: 10.1109/ETS.2014.6847816
    Presentation's date: 2014-05-29
    Presentation of work at congresses
  • Análisis y técnicas de mejora de la robustez y seguridad de circuitos nanométricos en presencia de ataques, defectos, variabilidad y Aging

     Balado, L.; Rius, J.; Manich, S.; Lamaison, R.; Renovell, M.; Lupon, E.; Arumi, D.; Rodriguez, R.
    Competitive project
  • Backside polishing detector

     Manich, S.; Arumi, D.; Rodriguez, R.; Sigl, G.; Mujal, J.
    Workshop on Secure Hardware and Security Evaluation
    Presentation's date: 2013-12-13
    Presentation of work at congresses
  • Diagnosis of interconnect full open defects in the presence of gate leakage currents

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 32, num. 2, p. 301-312
    DOI: 10.1109/TCAD.2012.2228269
    Date of publication: 2013-02
    Journal article
  • BIST Architecture to Detect Defects in TSVs During Pre-Bond Testing

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE European Test Symposium
    DOI: 10.1109/ETS.2013.6569389
    Presentation of work at congresses
  • Adaptive self test of defective TSVs

     Rodriguez, R.; Arumi, D.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2012-11-30
    Presentation of work at congresses
  • Circuito de autotest integrado de TSVs

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date of request: 2012-10-09
    Invention patent
  • Gate leakage impact on full open defects in interconnect lines  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on very large scale integration (VLSI) systems
    Vol. 19, num. 12, p. 2209-2220
    DOI: 10.1109/TVLSI.2010.2077315
    Date of publication: 2011-12
    Journal article
    Access to the full text
  • Diagnosis of Interconnect Full Open Defects in the Presence of Fan-Out

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 30, num. 12, p. 1911-1922
    DOI: 10.1109/TCAD.2011.2165071
    Date of publication: 2011-12
    Journal article
  • 8T SRAM Cell with Open Defects under Voltage and Timing Variations  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Castillo, R.
    Conference on Design of Circuits and Integrated Systems
    p. 155-160
    Presentation's date: 2011-11-16
    Presentation of work at congresses
    Access to the full text
  • Impacto de la variabilidad en las estrategias de test y diagnóstico de circuitos micro/nanoelectrónicos

     Balado, L.; Sanahuja, R.; Lupon, E.; Rius, J.; Rodriguez, R.; Manich, S.; Vatajelu, E.; Arumi, D.; Figueras, J.
    Competitive project
  • Simulations of interconnect open faults

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date: 2010-11
    Report
  • Defective Behaviour of an 8T SRAM Cell with Open Defects

     Rodriguez, R.; Arumi, D.; Manich, S.; Figueras, J.; Stefano Di Carlo; Paolo Prinetto; Scionti, A.
    International Conference on Advances in System Testing and Validation Lifecycle
    p. 81-86
    DOI: 10.1109/VALID.2010.19
    Presentation's date: 2010-08-24
    Presentation of work at congresses
  • Diagnosis of full open defects in interconnect lines with fan-out  Open access

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE European Test Symposium
    p. 233-238
    Presentation's date: 2010-05-27
    Presentation of work at congresses
    Access to the full text
  • Localization and Electrical Characterization of Interconnect Open Defects  Open access

     Rodriguez, R.; Arumi, D.; Figueras, J.; Beverloo, W.; de Vries, D.; Eichenberger, S.; Volf, P.
    IEEE transactions on semiconductor manufacturing
    Vol. 23, num. 1, p. 65-76
    DOI: 10.1109/TSM.2009.2039187
    Date of publication: 2010-02
    Journal article
    Access to the full text
  • Diagnosis of Full Open Defects in Interconnect Lines with Large Fan-out

     Arumi, D.; Rodríguez-Montañés, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2009-11-18
    Presentation of work at congresses
  • Open defects in nanometer technologies

     Figueras, J.; Rodriguez, R.; Arumi, D.
    DOI: 10.1007/978-90-481-3282-9
    Date of publication: 2009-11-01
    Book chapter
    Image
  • Models for Bridging Defects

     Renovell, M.; Azais, F.; Figueras, J.; Rodriguez, R.; Arumi, D.
    DOI: 10.1007/978-90-481-3282-9
    Date of publication: 2009-11-01
    Book chapter
    Image
  • Delay caused by resistive opens in interconnecting lines

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Integration. The VLSI journal
    Vol. 42, num. 3, p. 286-293
    Date of publication: 2009-06
    Journal article
  • Qualitat en Electrònica: Disseny de Baix Consum, Test, Verificació i Tolerància a Fallades

     Figueras, J.; Carrasco, J.; Lupon, E.; Manich, S.; Rodriguez, R.; Rius, J.; Balado, L.; Ferre, A.; Suñe, V.; Arumi, D.; Sanahuja, R.
    Competitive project
  • HI2008-0041 Acción integrada de investigación científica y tecnológica entre España e Italia

     Arumi, D.; Rodriguez, R.; Figueras, J.; Manich, S.
    Competitive project
  • Impact of Gate Leakage Currents on Full Open Defects in SRAM Cells

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2008-11-12
    Presentation of work at congresses
  • Time-dependent behaviour of full open defects in interconnecting lines

     Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    INTERNATIONAL TEST CONFERENCE
    p. 1-10
    Presentation's date: 2008-10-29
    Presentation of work at congresses
  • Enhancement of defect diagnosis based on the analysis of CMOS DUT behaviour  Open access

     Arumi, D.
    Department of Electronic Engineering, Universitat Politècnica de Catalunya
    Theses
  • VTS07 Best Paper Award

     Arumi, D.; Rodriguez, R.; Figueras, J.; Rodríguez-Montañés, R.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.
    Award or recognition
  • Full open defects under tunnelling leakage current in nanometric CMOS

     Arumi, D.; Rodríguez-Montañés, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    IEEE VLSI Test Symposium
    p. 119-124
    Presentation's date: 2008-04-28
    Presentation of work at congresses
  • Experimental Characterization of CMOS Interconnect Open Defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    IEEE transactions on computer-aided design of integrated circuits and systems
    Vol. 27, num. 1, p. 123-136
    Date of publication: 2008-01
    Journal article
  • Impact of Gate Tunnelling Leakage on CMOS Circuits with Full Open Defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2007-11-22
    Presentation of work at congresses
  • Impact of gate tunnelling leakage on CMOS circuits with full open defects  Open access  awarded activity

     Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.
    Electronics Letters
    Vol. 43, num. Issue 21, p. 1140-1141
    DOI: 10.1049/el:20072117
    Date of publication: 2007-10
    Journal article
    Access to the full text
  • TEC2007-66672 DIAGNOSTICO EN TECNOLOGIAS CMOS NANOMETRICAS: MEJORA DEL RENDIMIENTO

     Arumi, D.; Rodriguez, R.; Lupon, E.; Manich, S.; Rius, J.; Balado, L.
    Competitive project
  • Process-variability aware delay fault testing of ·VT and weak-open defects

     Arumi, D.; Rodriguez, R.; Pineda, J.; Gronthoud, G.
    The Eighth IEEE European Test Workshop
    p. 85-90
    Presentation's date: 2007-05-27
    Presentation of work at congresses
  • Diagnosis of Bridging Defects Based On Current Signatures at Low Power Supply Voltages

     Rodriguez, R.; Arumi, D.; Figueras, J.; Einchenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.
    IEEE VLSI Test Symposium
    p. 145-150
    Presentation's date: 2007-05-07
    Presentation of work at congresses
  • Diagnosis of full open defects in interconnecting lines  Open access  awarded activity

     Rodriguez, R.; Arumi, D.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.; Majhi, A.K.
    IEEE VLSI Test Symposium
    p. 1-6
    DOI: 10.1109/TEST.2008.4700575
    Presentation's date: 2007-05-07
    Presentation of work at congresses
    Access to the full text
  • IDDQ-based diagnosis at very low voltage (VLV) for bridging defects

     Arumi, D.; Rodriguez, R.; Figueras, J.; Eichenberger, S.; Hora, C.; Kruseman, B.; Lousberg, M.
    Electronics Letters
    Vol. 43, num. Issue 5, p. 25-26
    Date of publication: 2007-03
    Journal article
  • Letter of the Month

     Arumi, D.; Rodriguez, R.; Figueras, J.; Rodríguez-Montañés, R.; Eichenberger, S.; Hora, C.; Kruseman, B.
    Award or recognition
  • Experimental Characterization of CMOS Interconnect Open Defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2006-11-22
    Presentation of work at congresses
  • Effectiveness of very low voltage testing of bridging defects

     Rodriguez-Montanes, R.; Rodriguez, R.; Arumi, D.; Figueras, J.
    Electronics Letters
    Vol. 42, num. 19, p. 1083-1084
    Date of publication: 2006-09
    Journal article
  • Full open segment model in interconnecting lines

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date: 2006-09-01
    Report
  • Diagnosis of bridging defects

     Arumi, D.; Rodriguez, R.; Figueras, J.
    Date: 2006-07-03
    Report
  • Defective Behaviours of Resistive Opens in Interconnect Lines

     Arumi, D.; Rodriguez, R.; Figueras, J.
    10th European Test Symposium
    p. 28-33
    Presentation's date: 2005-05-23
    Presentation of work at congresses