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Entropy characterisation of overstressed capacitors for lifetime prediction

Autor
Cuadras, A.; Romero, R.; Ovejas, V.J.
Tipus d'activitat
Article en revista
Revista
Journal of power sources
Data de publicació
2016-12-30
Volum
336
Pàgina inicial
272
Pàgina final
278
DOI
https://doi.org/10.1016/j.jpowsour.2016.10.077 Obrir en finestra nova
Projecte finançador
FPU12/06265 - Beca de Formación de Profesorado Universitario
Reutilización y Vida de Baterías y Energía
Repositori
http://hdl.handle.net/2117/100599 Obrir en finestra nova
URL
http://www.sciencedirect.com/science/article/pii/S037877531631477X Obrir en finestra nova
Resum
We propose a method to monitor the ageing and damage of capacitors based on their irreversible entropy generation rate. We overstressed several electrolytic capacitors in the range of 33 µF–100 µF and monitored their entropy generation rate View the MathML source(t ). We found a strong relationship between capacitor degradation and View the MathML source(t ). Therefore, we proposed a threshold for View the MathML source(t ) as an indicator of capacitor time-to-failure. This magnitude is r...
Citació
Cuadras, A., Romero, R., Ovejas, V.J. Entropy characterisation of overstressed capacitors for lifetime prediction. "Journal of power sources", 30 Desembre 2016, vol. 336, p. 272-278.
Paraules clau
Ageing, Capacitor, Damage, ESR, Entropy, Joule effect, Reliability, Wear out
Grup de recerca
GRUP ISI - Grup d'Instrumentació, Sensors i Interfícies

Participants