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Effects of photon reabsorption phenomena in confocal micro-photoluminescence measurements in crystalline silicon

Autor
Roige, A.; Alvarez, J.; Jaffre, A.; Desrues, T.; Martin, I.; Alcubilla, R.; Kleider, J.
Tipus d'activitat
Article en revista
Revista
Journal of applied physics
Data de publicació
2017-02-14
Volum
121
Número
6
Pàgina inicial
1
Pàgina final
8
DOI
https://doi.org/10.1063/1.4975476 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/101546 Obrir en finestra nova
URL
http://aip.scitation.org/doi/10.1063/1.4975476 Obrir en finestra nova
Resum
Confocal micro-photoluminescence (PL) spectroscopy has become a powerful characterization technique for studying novel photovoltaic (PV) materials and structures at the micrometer level. In this work, we present a comprehensive study about the effects and implications of photon reabsorption phenomena on confocal micro-PL measurements in crystalline silicon (c-Si), the workhorse material of the PV industry. First, supported by theoretical calculations, we show that the level of reabsorption is in...
Citació
Roige, A., Alvarez, J., Jaffre, A., Desrues, T., Martin, I., Alcubilla, R., Kleider, J. Effects of photon reabsorption phenomena in confocal micro-photoluminescence measurements in crystalline silicon. "Journal of applied physics", 14 Febrer 2017, vol. 121, núm. 6, p. 063101-1-063101-8.
Paraules clau
Confocal micro-photoluminescence, Photovoltaic materials, Spectroscopy
Grup de recerca
MNT - Grup de Recerca en Micro i Nanotecnologies

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