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Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing

Autor
Álvaro Gómez-Pau; Balado, L.; Figueras, J.
Tipus d'activitat
Article en revista
Revista
Journal of Electronic Testing: Theory and Applications (JETTA)
Data de publicació
2017-02-20
Pàgina inicial
1
Pàgina final
14
DOI
https://doi.org/10.1007/s10836-017-5648-y Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/101939 Obrir en finestra nova
URL
http://link.springer.com/article/10.1007%2Fs10836-017-5648-y Obrir en finestra nova
Resum
One of the most challenging aspects in nowadays microelectronics industry is production test and verification of mixed-signal circuits. In order to cope with some of the drawbacks encountered in this scenario, researchers have found alternate test as a promising solution in achieving such endeavor. This work prospects the possibilities of using space tessellations along multiple directions in order to improve the test decision boundary definition in the alternate measure space. The proposed meth...
Citació
Álvaro Gómez-Pau, Balado, L., Figueras, J. Multi-directional space tessellation to improve the decision boundary in indirect mixed-signal testing. "Journal of Electronic Testing: Theory and Applications (JETTA)", 20 Febrer 2017, p. 1-14.
Paraules clau
Alternate test, Analog metrics, Band-pass filter, Biquad filter, Classifiers, Feature selection, Indirect measurements, Measurements selection, Mixed-signal test, Octrees2n-Trees, Quadtrees, Test escapes, Yield loss
Grup de recerca
CRnE - Centre de Recerca en Ciència i Enginyeria Multiescala de Barcelona
QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat

Participants