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1 to 19 of 19 results
 
  • An efficient behavioral description frontend tool for mixed-mode SPICE simulation  Open access

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan; Chatterjee, Abhijit
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-28
    Presentation of work at congresses
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  • Quality metrics for mixed-signal indirect testing  Open access

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    p. 1-6
    Presentation's date: 2014-11-26
    Presentation of work at congresses
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  • Error resilient real-time state variable systems signal processing and control

     Banerjee, Suvadeep; Gómez Pau, Álvaro; Chatterjee, Abhijit; Abraham, Jacob
    Asian Test Symposium
    p. 39-44
    DOI: 10.1109/ATS.2014.19
    Presentation's date: 2014-11-17
    Presentation of work at congresses
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  • Real-time transient error and induced noise cancellation in linear analog filters using learning-assisted adaptive analog checksums

     Gómez Pau, Álvaro; Banerjee, Suvadeep; Chatterjee, Abhijit
    IEEE International On-Line Testing Symposium
    p. 25-30
    DOI: 10.1109/IOLTS.2014.6873667
    Presentation's date: 2014-07
    Presentation of work at congresses
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  • Criteria for indirect measurements in M-S testing

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Workshop on Statistical Test Methods
    p. 1-6
    Presentation's date: 2014-05-30
    Presentation of work at congresses
    Image
  • M-S specification binning based on digitally coded indirect measurements

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    IEEE European Test Symposium
    p. 105-110
    Presentation's date: 2014-05-28
    Presentation of work at congresses
  • Design of low cost fault tolerant analog circuits using real-time learned error compensation

     Banerjee, Suvadeep; Gómez Pau, Álvaro; Chatterjee, Abhijit
    IEEE European Test Symposium
    p. 229-230
    Presentation's date: 2014-05-27
    Presentation of work at congresses
  • Diagnosis of parametric defects in dual axis IC accelerometers

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Microsystem technologies-Micro-and nanosystems-Information storage and processing
    DOI: 10.1007/s00542-014-2218-4
    Date of publication: 2014-05-22
    Journal article
  • SRAM cell stability metric under transient voltage noise

     Vatajelu, Elena Iona; Gómez Pau, Álvaro; Renovell, Michel; Figueras Pamies, Juan
    Microelectronics journal
    Vol. 45, num. 10, p. 1348-1353
    DOI: 10.1016/j.mejo.2013.11.005
    Date of publication: 2013-12-20
    Journal article
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  • Test of dual axis accelerometers based on specifications compliance  Open access

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2013-11-28
    Presentation of work at congresses
    Access to the full text
  • M-S test based on specification validation using octrees in the measure space

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    IEEE European Test Symposium
    p. 70-75
    DOI: 10.1109/ETS.2013.6569359
    Presentation's date: 2013-05-28
    Presentation of work at congresses
    Image
  • Nondestructive diagnosis of mechanical misalignments in dual axis accelerometers

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Design, Test, Integration & Packaging of MEMS/MOEMS
    Presentation's date: 2013-04-18
    Presentation of work at congresses
    Image
  • SRAM stability metric under transient noise  Open access

     Gómez Pau, Álvaro; Renovell, Michel; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    Presentation's date: 2012-11-30
    Presentation of work at congresses
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  • Built-In test of MEMS capacitive accelerometers for field failures and aging degradation.  Open access

     Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    p. 223-228
    Presentation's date: 2012-11-28
    Presentation of work at congresses
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  • Testing dual axis IC accelerometers using Lissajous compositions

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    p. 1-4
    Presentation's date: 2011-11-17
    Presentation of work at congresses
  • Testing IC accelerometers using Lissajous compositions

     Gómez Pau, Álvaro; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Perspective Technologies and Methods in MEMS Design
    p. 75-81
    Presentation's date: 2011-05-11
    Presentation of work at congresses
    Image
  • Transient noise failures in SRAM cells : dynamic noise margin metric

     Gómez Pau, Álvaro; Renovell, Michel; Figueras Pamies, Juan; Vatajelu, Elena Iona
    Asian Test Symposium
    p. 413-418
    DOI: 10.1109/ATS.2011.64
    Presentation's date: 2011
    Presentation of work at congresses
    Image
  • Identification of component deviations in analog circuits using digital signatures

     Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Conference on Design of Circuits and Integrated Systems
    p. 187-192
    Presentation's date: 2010-11-17
    Presentation of work at congresses
    Image
  • Analog circuit test based on a digital signature  Open access

     Gómez Pau, Álvaro; Sanahuja Moliner, Ricard; Balado Suarez, Luz Maria; Figueras Pamies, Juan
    Design, Automation and Test in Europe
    p. 1641-1644
    Presentation's date: 2010-03-08
    Presentation of work at congresses
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