Carregant...
Carregant...

Vés al contingut (premeu Retorn)

Report 1 Consolider PV

Autor
Silvestre, S.
Tipus d'activitat
Document cientificotècnic
Data
2010-09-09
Repositori
http://hdl.handle.net/2117/106646 Obrir en finestra nova
Resum
Report Projecte de Recerca Consolider Ingenio. PV Thin films of GaAs(Ti), ranging from 90nm to 250 nm thick, were grown by sputtering on glass substrates.-Tof-SIMS measurements absorbance of reference samples and optical gap were evaluated.
Citació
Silvestre, S. "Report 1 Consolider PV". 2010.
Paraules clau
Gaas(ti), Tof-sims Measurements, Absorption
Grup de recerca
MNT - Grup de Recerca en Micro i Nanotecnologies

Participants

Arxius