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Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements

Autor
Aldrete, H.E.; Mateo, D.; Altet, J.; Amine, M.; Grauby, S.; Dilhaire, S.; Onabajo, M.; Silva, J.
Tipus d'activitat
Article en revista
Revista
Measurement science and technology
Data de publicació
2010-06-08
Volum
21
Número
7
Pàgina inicial
1
Pàgina final
10
DOI
https://doi.org/10.1088/0957-0233/21/7/075104 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/8325 Obrir en finestra nova
URL
http://iopscience.iop.org/0957-0233/21/7/075104/pdf/0957-0233_21_7_075104.pdf Obrir en finestra nova
Resum
This paper presents two approaches to characterize RF circuits with built-in differential temperature measurements, namely the homodyne and heterodyne methods. Both non-invasive methods are analyzed theoretically and discussed with regard to the respective trade-offs associated with practical off-chip methodologies as well as on-chip measurement scenarios. Strategies are defined to extract the center frequency and 1 dB compression point of a narrow-band LNA operating around 1 GHz. The proposed t...
Citació
Aldrete, E. [et al.]. Strategies for built-in characterization testing and performance monitoring of analog RF circuits with temperature measurements. "Measurement science and technology", 08 Juny 2010, vol. 21, núm. 7, p. 1-10.
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

Participants

  • Aldrete Vidrio, Hector Eduardo  (autor)
  • Mateo Peña, Diego Cesar  (autor)
  • Altet Sanahujes, Josep  (autor)
  • Amine Salhi, M.  (autor)
  • Grauby, Stéphane  (autor)
  • Dilhaire, Stefan  (autor)
  • Onabajo, M.  (autor)
  • Silva Martinez, Jose  (autor)

Arxius