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Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect

Autor
Perpiñà, X.; Altet, J.; Jordà, X.; Vellvehi, M.; Mestres, N.
Tipus d'activitat
Article en revista
Revista
Optics letters
Data de publicació
2010
Volum
35
Número
15
Pàgina inicial
2657
Pàgina final
2659
DOI
https://doi.org/10.1364/OL.35.002657 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/10951 Obrir en finestra nova
URL
http://www.opticsinfobase.org/abstract.cfm?uri=ol-35-15-2657 Obrir en finestra nova
Resum
This Letter presents a solution for locating hot spots in active integrated circuits (IC) and devices. This method is based on sensing the phase lag between the power periodically dissipated by a device integrated in an IC (hot spot) and its corresponding thermal gradient into the chip substrate by monitoring the heat-induced refractive index gradient with a laser beam. The experimental results show a high accuracy and prove the suitability of this technique to locate and characterize devices be...
Citació
Perpiñà, X. [et al.]. Location of hot spots in integrated circuits by monitoring the substrate thermal-phase lag with the mirage effect. "Optics Letters", 2010, vol. 35, núm. 15, p. 2657-2659.
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

Participants

  • Perpiñà Gilabet, Xavier  (autor)
  • Altet Sanahujes, Josep  (autor)
  • Jordà, Xavier  (autor)
  • Vellvehi, Miquel  (autor)
  • Mestres Andreu, Narcís  (autor)

Arxius