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Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations

Autor
Onabajo, M.; Gómez, D.; Aldrete, H.E.; Altet, J.; Mateo, D.; Silva, J.
Tipus d'activitat
Article en revista
Revista
Journal of electronic testing. Theory and applications
Data de publicació
2011-06
Volum
27
Número
3
Pàgina inicial
225
Pàgina final
240
DOI
https://doi.org/10.1007/s10836-011-5199-6 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/13127 Obrir en finestra nova
URL
http://www.springerlink.com/content/4h79q8r34x782072 Obrir en finestra nova
Resum
Built-in test and on-chip calibration features are becoming essential for reliable wireless connectivity of next generation devices suffering from increasing process variations in CMOS technologies. This paper contains an overview of contemporary self-test and performance enhancement strategies for single-chip transceivers. In general, a trend has emerged to combine several techniques involving process variability monitoring, digital calibration, and tuning of analog circuits. Special attention ...
Citació
Onabajo, M. [et al.]. Survey of robustness enhancement techniques for wireless systems-on-a-chip and study of temperature as observable for process variations. "Journal of electronic testing. Theory and applications", Juny 2011, vol. 27, núm. 3, p. 225-240.
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

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