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InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering

Autor
Serrano, J.; Bosak, A.; Krisch, M.; Manjón, F.; Romero, A.; Garro, N.; Wang, X.; Yoshikawa, A.; Kuball, M.
Tipus d'activitat
Article en revista
Revista
Physical review letters
Data de publicació
2011-05-19
Volum
106
Número
20
Pàgina inicial
1
Pàgina final
4
DOI
https://doi.org/10.1103/PhysRevLett.106.205501 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/13072 Obrir en finestra nova
URL
http://prl.aps.org/abstract/PRL/v106/i20/e205501 Obrir en finestra nova
Resum
Achieving comprehensive information on thin film lattice dynamics so far has eluded well established spectroscopic techniques. We demonstrate here the novel application of grazing incidence inelastic x-ray scattering combined with ab initio calculations to determine the complete elastic stiffness tensor, the acoustic and low-energy optic phonon dispersion relations of thin wurtzite indium nitride films. Indium nitride is an especially relevant example, due to the technological interest for optoe...
Citació
Serrano, J. [et al.]. InN thin film lattice dynamics by grazing incidence inelastic x-ray scattering. "Physical review letters", 19 Maig 2011, vol. 106, núm. 20, p. 1-4.
Grup de recerca
GCM - Grup de Caracterització de Materials

Participants

  • Serrano Gutierrez, Jorge  (autor)
  • Bosak, A.  (autor)
  • Krisch, M.  (autor)
  • Manjón Herrera, Francisco Javier  (autor)
  • Romero Castro, Aldo Humberto  (autor)
  • Garro Martínez, Nuria  (autor)
  • Wang, Xuan  (autor)
  • Yoshikawa, A.  (autor)
  • Kuball, Martin  (autor)