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Evaluation of titanium dental implants after failure of osseointegration by means of X-ray photoelectron spectroscopy, electron microscopy and histological studies

Autor
Lázaro, P.; Herrero-Climent, M.; Gil, F.J.
Tipus d'activitat
Article en revista
Revista
Journal of biomedical science and engineering
Data de publicació
2010
Volum
3
Número
11
Pàgina inicial
1073
Pàgina final
1077
DOI
https://doi.org/10.4236/jbise.2010.311139 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/15147 Obrir en finestra nova
Resum
In this work, we analysed 56 clinically failed and retrieved implants by means of scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and histological studies. The surface contamination was compared to that of unused control implants and with that of the same implants after cleaning in a basic medium. The surfaces of the unused implants presented considerable contamination. In particular, high levels of carbon were detected. The nature of this C was elucidated by XPS analy...
Citació
Lázaro, P.; Herrero-Climent, M.; Gil, F.J. Evaluation of titanium dental implants after failure of osseointegration by means of X-ray photoelectron spectroscopy, electron microscopy and histological studies. "Journal of Biomedical Science and Engineering", 2010, vol. 3, núm. 11, p. 1073-1077.
Grup de recerca
BBT - Biomaterials, Biomecànica i Enginyeria de Teixits
CREB - Centre de Recerca en Enginyeria Biomedica
CRnE - Centre de Recerca en Ciència i Enginyeria Multiescala de Barcelona

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