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Fault-tolerance capacity of the multilevel active clamped topology

Author
Nicolas-Apruzzese, J.; Busquets-Monge, S.; Bordonau, J.; Alepuz, S.; Calle, A.
Type of activity
Presentation of work at congresses
Name of edition
3rd IEEE Energy Conversion Congress and Exposition
Date of publication
2011
Presentation's date
2011
Book of congress proceedings
IEEE ECCE 2011 proceedings: IEEE Energy Conversion Congress and Exposition: September 17-22, 2011, Hyatt Regency Phoenix, Arizona
First page
3411
Last page
3418
Publisher
IEEE
DOI
https://doi.org/10.1109/ECCE.2011.6064230 Open in new window
Repository
http://hdl.handle.net/2117/19159 Open in new window
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6064230&tag=1 Open in new window
Abstract
Thanks to the inherent redundancy to generate the different output voltage levels, the multilevel active clamped (MAC) topology presents an important fault-tolerance ability which makes it interesting for several applications. This paper presents an analysis of the fault-tolerance capacity of the MAC converter. Both open-circuit and short-circuit faults are considered and the analysis is carried out under single-device and two-simultaneous-device faults. Switching strategies to overcome the limi...
Citation
Nicolas, J. [et al.]. Fault-tolerance capacity of the multilevel active clamped topology. A: IEEE Energy Conversion Congress and Exposition. "IEEE ECCE 2011 proceedings: IEEE Energy Conversion Congress and Exposition: September 17-22, 2011, Hyatt Regency Phoenix, Arizona". Phoenix, AR: IEEE, 2011, p. 3411-3418.
Keywords
CONVERTER
Group of research
GREP - Power Electronics Research Group
PERC-UPC - Power Electronics Research Centre

Participants