Loading...
Loading...

Go to the content (press return)

On line monitoring of RF power amplifiers with embedded temperature sensors

Author
Altet, J.; Mateo, D.; Gómez, D.
Type of activity
Presentation of work at congresses
Name of edition
18th IEEE International On-Line Testing Symposium
Date of publication
2012
Presentation's date
2012-06-29
Book of congress proceedings
Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium (IOLTS): 27-29 June 2012, Sitges, Spain
First page
1
Last page
5
Publisher
IEEE
Repository
http://hdl.handle.net/2117/16657 Open in new window
Abstract
In the present paper we analyze that DC temperature measurements of the silicon surface can be used to monitor the high frequency status and performances of class A RF Power Amplifiers. As a proof of concept, we present experimental results obtained with a 65 nm CMOS IC that contains a 2GHz linear class A Power Amplifier and a very simple differential temperature sensor. Results show that the PA output power can be tracked from DC temperature measurements.
Citation
Altet, J.; Mateo, D.; Gómez, D. On line monitoring of RF power amplifiers with embedded temperature sensors. A: IEEE International On-Line Testing Symposium. "2012 IEEE 18th International On-Line Testing Symposium (IOLTS), Sitges, Spain, June 27-29, 2012". Sitges, Barcelona: IEEE, 2012, p. 1-5.
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants