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Analysis of FinFET technology on memories

Author
Amat, Esteve; ASenov, A.; Canal, R.; Cheng, B.; Cruz, J.; Jaksic, Z.; Miranda, M.; Rubio, A.; Zuber, P.
Type of activity
Presentation of work at congresses
Name of edition
18th IEEE International On-Line Testing Symposium
Date of publication
2012
Presentation's date
2012-06-29
Book of congress proceedings
Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium (IOLTS): 27-29 June 2012, Sitges, Spain
First page
169
Last page
169
DOI
https://doi.org/10.1109/IOLTS.2012.6313866 Open in new window
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6313866 Open in new window
Group of research
ARCO - Microarchitecture and Compilers
HIPICS - High Performance Integrated Circuits and Systems
VIRTUOS - Virtualisation and Operating Systems

Participants

  • Amat Bertran, Esteve  (author and speaker )
  • ASenov, Asen  (author and speaker )
  • Canal Corretger, Ramon  (author and speaker )
  • Cheng, B.  (author and speaker )
  • Cruz Diaz, Josep-llorenç  (author and speaker )
  • Jaksic, Zoran  (author and speaker )
  • Miranda, Miguel  (author and speaker )
  • Rubio Sola, Jose Antonio  (author and speaker )
  • Zuber, Paul  (author and speaker )