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On the use of static temperature measurements as process variation observable

Autor
Gómez, D.; Altet, J.; Mateo, D.
Tipus d'activitat
Article en revista
Revista
Journal of electronic testing. Theory and applications
Data de publicació
2012-10
Volum
28
Número
5
Pàgina inicial
685
Pàgina final
695
DOI
https://doi.org/10.1007/s10836-012-5298-z Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/19875 Obrir en finestra nova
URL
http://link.springer.com/article/10.1007%2Fs10836-012-5298-z Obrir en finestra nova
Resum
In this paper we present the use of static temperature measurements as process variation observable. Contrary to previously published thermal testing methods, the proposed methodology does not need an excitation signal, thus reducing test cost and improving built-in capabilities of thermal monitoring. The feasibility of the technique and a complete test methodology is presented using a narrowband LNA as example. Finally, a complete electro-thermal co-simulation test bench between the LNA and a d...
Citació
Gómez, D.; Altet, J.; Mateo, D. On the use of static temperature measurements as process variation observable. "Journal of electronic testing. Theory and applications", Octubre 2012, vol. 28, núm. 5, p. 685-695.
Paraules clau
CMOS process variation, Design for manufacturability, RF built-in test, RF thermal testing, Thermal monitoring
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

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