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IR-drop in on-chip power distribution networks of ICs with nonuniform power consumption

Autor
Rius, J.
Tipus d'activitat
Article en revista
Revista
IEEE transactions on very large scale integration (VLSI) systems
Data de publicació
2012-03-20
Número
99
Pàgina inicial
512
Pàgina final
522
DOI
https://doi.org/10.1109/TVLSI.2012.2188918 Obrir en finestra nova
Projecte finançador
IMPACTO DE LA VARIABILIDAD EN LAS ESTRATEGIAS DE TEST Y DIAGNÓSTICO DE CIRCUITOS MICRO/NANOELECTRÓNICOS
Repositori
http://hdl.handle.net/2117/17195 Obrir en finestra nova
Resum
A compact IR-drop model for on-chip power distribution networks in array and wire-bonded ICs is analyzed. Chip dimensions, size, and location of the supply pads, metal coverage, piecewise distribution of IC consumption, and the resistance between the pads and the power supply are considered to obtain closed-form expressions for the IR-drop. The IR-drop model is validated by comparing its results with electrical simulations. The obtained error is in the range of 1%.
Citació
Rius, J. IR-drop in on-chip power distribution networks of ICs with nonuniform power consumption. "IEEE transactions on very large scale integration (VLSI) systems", 20 Març 2012, núm. 99, p. 1-11.
Paraules clau
IC modeling IR-drop power distribution networks (PDNs) power supply noise (PSN)
Grup de recerca
QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat

Participants