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Adaptive self test of defective TSVs

Author
Rodriguez-Montanes, R.; Arumi, D.; Figueras, J.
Type of activity
Presentation of work at congresses
Name of edition
XXVII Conference on Design of Circuits and Integrated Systems
Date of publication
2012
Presentation's date
2012-11-30
Group of research
CRnE - Barcelona Research Center in Multiscale Science and Engineering
QINE - Low Power Design, Test, Verification and Security ICs

Participants