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A Highly time sensitive XOR gate for probe attempt detectors

Autor
Manich, S.; Strasser, M.
Tipus d'activitat
Article en revista
Revista
IEEE transactions on circuits and systems II: express briefs
Data de publicació
2013-09-05
DOI
https://doi.org/10.1109/TCSII.2013.2278126 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/20153 Obrir en finestra nova
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6589211 Obrir en finestra nova
Resum
Probe attempt detectors are sensors designed to protect buses of secure chips against the physical contact of probes. The operation principle of these detectors relies on the comparison of the delay propagation times between lines. CMOS XOR gates are very well suited for this comparison since they are small, fast, and compatible with the technology used in secure chips. However, the lack of activity while comparing matched lines and the limited reaction time pose a risk for tampering and decreas...
Citació
Manich, S.; Strasser, M. A Highly time sensitive XOR gate for probe attempt detectors. "IEEE transactions on circuits and systems II: express briefs", 05 Setembre 2013.
Paraules clau
CMOS integrated circuits, Delays, Detectors, Logic gates, Probes, Standards, Transistors, logic gates, phase detection, smart cards
Grup de recerca
QINE - Disseny de Baix Consum, Test, Verificació i Circuits Integrats de Seguretat

Participants