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Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions

Autor
Santos, S.; Gadelrab, K.R.; Font, J.; Chiesa, M.
Tipus d'activitat
Article en revista
Revista
New journal of physics
Data de publicació
2013-08
Volum
15
DOI
https://doi.org/10.1088/1367-2630/15/8/083034 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/20385 Obrir en finestra nova
URL
http://iopscience.iop.org/1367-2630/15/8/083034/pdf/1367-2630_15_8_083034.pdf Obrir en finestra nova
Resum
Here, we enhance the capabilities of the atomic force microscope (AFM) to show that force profiles can be reconstructed without restriction by monitoring the wave profile of the cantilever during a single oscillation cycle. Two approaches are provided to reconstruct the force profile in both the steady and transient states in what we call single-cycle measurements. The robustness of the formalism is tested numerically to recover complex but relevant interactions. With single-cycle measurements, ...
Citació
Santos, S.M. [et al.]. Single-cycle atomic force microscope force reconstruction: Resolving time-dependent interactions. "New journal of physics", Agost 2013, vol. 15.
Paraules clau
Feedback options, Force reconstruction, High sensitivity, High temporal resolution, Oscillation cycles, Spatial resolution, Steady and transient state, Time-dependent interaction.
Grup de recerca
CIRCUIT - Grup de Recerca en Circuits i Sistemes de Comunicació
PERC-UPC - Centre de Recerca d'Electrònica de Potència UPC
SSR-UPC - Smart Sustainable Resources

Participants

  • Santos Hernandez, Sergio  (autor)
  • Gadelrab, Karim Raafat  (autor)
  • Font Teixido, Jose  (autor)
  • Chiesa, Matteo  (autor)

Arxius