Loading...
Loading...

Go to the content (press return)

Effects of nonidealities in switching frequency modulation techniques:application to Coupled Interleaved Multicellular Parallel converters

Author
Mon, J.; Gonzalez, D.; Ferrer-Arnau, Ll.; Labrousse, D.; Costa, F.
Type of activity
Presentation of work at congresses
Name of edition
15th European Conference on Power Electronics and Applications
Date of publication
2013
Presentation's date
2013-09-02
Book of congress proceedings
Proceedings of the 15th European Conference on Power Electronics and Applications
First page
1
Last page
8
DOI
https://doi.org/10.1109/EPE.2013.6631829 Open in new window
Repository
http://hdl.handle.net/2117/20814 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6631829&isnumber=6631728 Open in new window
Abstract
This paper explores the application of the Variable Delay Frequency Modulation (VDFM) to an Interleaved Multicellular Parallel converter. VDFM is a modulation technique specially intended to reduce conducted EMI generated by parallel converters. This technique combines interleaving and frequency modulation in such a way that provides the best attenuation. On the other hand, Coupled Interleaved Multicelular Parallel Converters (CIMPC) needs a perfect current sharing among phases. In this pap...
Citation
Mon, J. [et al.]. Effects of nonidealities in switching frequency modulation techniques:application to Coupled Interleaved Multicellular Parallel converters. A: European Conference on Power Electronics and Applications. "Proceedings of the 15th European Conference on Power Electronics and Applications". Lille: 2013, p. 1-8.
Keywords
«EMC/EMI», «Interleaved converters », «Modulation strategy », «Pulse Width Modulation (PWM)»
Group of research
DISEN - Distributed Sensor Networks
Electromagnetic Compatibility (EMC); Widebandgap (WBG); Internal Activity; Feature Selective Validation (FSV); Spread Spectrum modulation; Reliability; Multilevel Converters; Fault detection;
PERC-UPC - Power Electronics Research Centre

Participants

Attachments