Carregant...
Carregant...

Vés al contingut (premeu Retorn)

MOSFET temperature sensors for on-chip thermal testing

Autor
Reverter, F.; Altet, J.
Tipus d'activitat
Article en revista
Revista
Sensors and actuators A. Physical
Data de publicació
2013-12-01
Volum
203
Pàgina inicial
234
Pàgina final
240
DOI
https://doi.org/10.1016/j.sna.2013.08.026 Obrir en finestra nova
Projecte finançador
Design And Test Principles For Terascale Integrated Systems
GRUP DE RECERCA DE CIRCUITS I SISTEMES INTEGRATS D'ALTES PRESTACIONS (HIPICS)
URL
http://www.sciencedirect.com/science/article/pii/S092442471300410X Obrir en finestra nova
Resum
This paper analyses theoretically and experimentally the temperature dependence of metal-oxide-semiconductor field-effect transistors (MOSFET) with the aim of using them as a temperature sensor in on-chip thermal testing applications. The proposed analysis provides rules for the selection of the dimensions and the bias current of the MOSFET in order to have a high sensitivity to on-chip thermal variations generated by the circuit under test (CUT). These theoretical predictions are then contraste...
Paraules clau
MOSFET sensor, Temperature sensor, Thermal testing
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions
e-CAT - Circuits i Transductors Electrònics

Participants