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Differential scan-path: A novel solution for secure design-for-testability

Author
Manich, S.; Wamser, M. S.; Guillen, O.; Sigl, G.
Type of activity
Presentation of work at congresses
Name of edition
2013 IEEE International Test Conference
Date of publication
2013
Presentation's date
2013-09-11
Book of congress proceedings
IEEE International Test Conference
First page
1
Last page
9
DOI
https://doi.org/10.1109/TEST.2013.6651902 Open in new window
Repository
http://hdl.handle.net/2117/21393 Open in new window
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6651902 Open in new window
Abstract
In this paper, we present a new scan-path structure for improving the security of systems including scan paths, which normally introduce a security critical information leak channel into a design. Our structure, named differential scan path (DiSP), divides the internal state of the scan path in two sections. During the shift-out operation, only subtraction of the two sections is provided. Inferring the internal state from this subtraction requires much guesswork that increases exponen-tially wit...
Citation
Manich, S. [et al.]. Differential scan-path: A novel solution for secure design-for-testability. A: IEEE International Test Conference. "IEEE International Test Conference". Califòrnia: 2013, p. 1-9.
Keywords
BILBO, attack, scan path, security, testability
Group of research
QINE - Low Power Design, Test, Verification and Security ICs

Participants

  • Manich Bou, Salvador  (author and speaker )
  • Wamser, Markus S.  (author and speaker )
  • Guillen, Oscar M.  (author and speaker )
  • Sigl, Georg  (author and speaker )