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Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery

Author
Upasani, G.; Vera, F.J.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
19th IEEE International On-Line Testing Symposium
Date of publication
2013
Presentation's date
2013-07-08
Book of congress proceedings
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS): 8-10 July 2013: Chania, Crete, Greece
First page
85
Last page
91
Publisher
IEEE Computer Society Publications
DOI
https://doi.org/10.1109/IOLTS.2013.6604056 Open in new window
Project funding
MICROARQUITECTURA Y COMPILADORES PARA FUTUROS PROCESADORES II
Repository
http://hdl.handle.net/2117/21830 Open in new window
URL
http://ieeexplore.ieee.org/document/6604056/ Open in new window
Abstract
Cosmic radiation induced soft errors have emerged as a key challenge in computer system design. The exponential increase in the transistor count will drive the per chip fault rate sky high. New techniques for detecting errors in the logic and memories that allow meeting the desired failures in-time (FIT) budget in future chip multiprocessors (CMPs) are essential. Among the two major contributors towards soft error rate, silent data corruption (SDC) and detected unrecoverable error (DUE), DUE is ...
Citation
Upasani, G.; Vera, X.; Gonzalez, A. Reducing DUE-FIT of caches by exploiting acoustic wave detectors for error recovery. A: IEEE International On-Line Testing Symposium. "Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS): 8-10 July 2013: Chania, Crete, Greece". Chania: IEEE Computer Society Publications, 2013, p. 85-91.
Keywords
Accuracy, Acoustic waves, Detectors, Equations, Estimation, Mathematical model, Program processors
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Upasani, Gaurang  (author and speaker )
  • Vera Rivera, Francisco Javier  (author and speaker )
  • Gonzalez Colas, Antonio Maria  (author and speaker )