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Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches

Autor
Pouyan, P.; Amat, Esteve; Barajas, E.; Rubio, A.
Tipus d'activitat
Presentació treball a congrés
Nom de l'edició
15th International Symposium on Quality Electronic Design
Any de l'edició
2014
Data de presentació
2014-03
Llibre d'actes
Proceedings - International Symposium on Quality Electronic Design
Pàgina inicial
32
Pàgina final
38
DOI
https://doi.org/10.1109/ISQED.2014.6783303 Obrir en finestra nova
Repositori
http://hdl.handle.net/2117/24778 Obrir en finestra nova
Resum
This work presents a test and measurement technique to monitor aging and process variation status of SRAM cells as an aging-aware design technique. We have then verified our technique with an implemented chip. The obtained aging information are utilized to guide our proactive strategies, and to track the impact of aging in new reconfiguration techniques for cache memory structures. Our proactive techniques improve the reliability, extend the SRAMs lifetime, and reduce the Vmin drift in presence ...
Citació
Pouyan, P. [et al.]. Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches. A: International Symposium on Quality Electronic Design. "Proceedings - International Symposium on Quality Electronic Design". Santa Clara: 2014, p. 32-38.
Paraules clau
BTI, Process Variation, Reconfiguration, SRAM, Vmin
Grup de recerca
HIPICS - Grup de Circuits i Sistemes Integrats d'Altes Prestacions

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