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Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches

Author
Pouyan, P.; Amat, Esteve; Barajas, E.; Rubio, A.
Type of activity
Presentation of work at congresses
Name of edition
15th International Symposium on Quality Electronic Design
Date of publication
2014
Presentation's date
2014-03
Book of congress proceedings
Proceedings - International Symposium on Quality Electronic Design
First page
32
Last page
38
DOI
https://doi.org/10.1109/ISQED.2014.6783303 Open in new window
Repository
http://hdl.handle.net/2117/24778 Open in new window
Abstract
This work presents a test and measurement technique to monitor aging and process variation status of SRAM cells as an aging-aware design technique. We have then verified our technique with an implemented chip. The obtained aging information are utilized to guide our proactive strategies, and to track the impact of aging in new reconfiguration techniques for cache memory structures. Our proactive techniques improve the reliability, extend the SRAMs lifetime, and reduce the Vmin drift in presence ...
Citation
Pouyan, P. [et al.]. Impact of adaptive proactive reconfiguration technique on Vmin and lifetime of SRAM caches. A: International Symposium on Quality Electronic Design. "Proceedings - International Symposium on Quality Electronic Design". Santa Clara: 2014, p. 32-38.
Keywords
BTI, Process Variation, Reconfiguration, SRAM, Vmin
Group of research
HIPICS - High Performance Integrated Circuits and Systems

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