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Application of the feature selective validation method to pattern recognition

Author
Ventosa, O.; Pous, M.; Silva, F.; Jaúregui, R.I.
Type of activity
Journal article
Journal
IEEE transactions on electromagnetic compatibility
Date of publication
2014-08-01
Volume
56
Number
4
First page
808
Last page
816
DOI
https://doi.org/10.1109/TEMC.2013.2291494 Open in new window
Repository
http://hdl.handle.net/2117/25346 Open in new window
Abstract
Pattern recognition is a mature field; however, in recent years it has developed a special interest. Many methods have been developed exclusively focusing on this subject; all of them, however, are centered on certain types of patterns. In this paper, a new method, which aims to be as flexible as possible, is proposed. This technique is based on a validation standard method used in electromagnetic compatibility named feature selective validation. The final objective of developing the algorithm i...
Citation
Ventosa, O. [et al.]. Application of the Feature Selective Validation Method to Pattern Recognition. "IEEE transactions on electromagnetic compatibility", 01 Agost 2014, vol. 56, núm. 4, p. 808-816.
Keywords
COMPUTATIONAL ELECTROMAGNETICS CEM, Computational electromagnetics method, FSV, PERFORMANCE, SYSTEM, data comparison, feature selective validation (FSV) method, pattern recognition, validation
Group of research
GCEM - Electromagnetic Compatibility Group
IEB - Electronic and Biomedical Instrumentation

Participants