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Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes

Author
Altet, J.; Aldrete, H.E.; Reverter, F.; Gómez, D.; Gonzalez, J.; Onabajo, M.; Silva-Martínez, J.; Martineau, B.; Perpiñà, X.; Abdallah, L.; Stratigopoulos, H.; Aragones, X.; Jordà, X.; Vellvehi, M.; Dilhaire, S.; Mir, S.; Mateo, D.
Type of activity
Presentation of work at congresses
Name of edition
IEEE 57th International Midwest Symposium on Circuits and Systems
Date of publication
2014
Presentation's date
2014-08-06
Book of congress proceedings
2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS): August 3-6, 2014: College Station, Texas
First page
1081
Last page
1084
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/MWSCAS.2014.6908606 Open in new window
Project funding
Grup de Recerca Reconegut i Finançat per la Generalitat de Catalunya (GRC)
Multilevel approach to the reliability-aware design of analog and digital integrated circuits
Repository
http://hdl.handle.net/2117/24703 Open in new window
URL
http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6908606 Open in new window
Abstract
This paper presents an overview of the work done so far related to the use of temperature sensors as performance monitors for RF and MMW circuits with the goal to implement built-in testing or self-calibration techniques. The strategy is to embed small temperature sensors on the same silicon die as the circuit under test, taking advantage of empty spaces in the layout. This paper reviews the physical principles, and presents examples that reveal how temperature sensors can be used as functional ...
Citation
Altet, J. [et al.]. Review of temperature sensors as monitors for RFMMW built-in testing and self-calibration schemes. A: IEEE International Midwest Symposium on Circuits and Systems. "2014 IEEE 57th International Midwest Symposium on Circuits and Systems (MWSCAS): August 3-6, 2014: College Station, Texas". Texas: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 1081-1084.
Keywords
Built-in self test, Calibration, Circuit testing, Elemental semiconductors, Millimetre wave circuits, Silicon, Temperature sensors
Group of research
HIPICS - High Performance Integrated Circuits and Systems
e-CAT - Electronic Circuits and Transducers

Participants

  • Altet Sanahujes, Josep  (author and speaker )
  • Aldrete Vidrio, Hector Eduardo  (author and speaker )
  • Reverter Cubarsí, Ferran  (author and speaker )
  • Gómez Salinas, Didac  (author and speaker )
  • Gonzalez Jimenez, Jose Luis  (author and speaker )
  • Onabajo, Marvin  (author and speaker )
  • Silva Martinez, José  (author and speaker )
  • Martineau, B  (author and speaker )
  • Perpiñà Gilabet, Xavier  (author and speaker )
  • Abdallah, Louay  (author and speaker )
  • Stratigopoulos, Haralampos-G.  (author and speaker )
  • Aragones Cervera, Xavier  (author and speaker )
  • Jordà, Xavier  (author and speaker )
  • Vellvehi, Miquel  (author and speaker )
  • Dilhaire, Stefan  (author and speaker )
  • Mir, Salvador  (author and speaker )
  • Mateo Peña, Diego Cesar  (author and speaker )