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Framework for economical error recovery in embedded cores

Author
Upasani, G.; Vera, F.J.; Gonzalez, A.
Type of activity
Presentation of work at congresses
Name of edition
20th IEEE International On-Line Testing Symposium
Date of publication
2014
Presentation's date
2014-07-07
Book of congress proceedings
Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium (IOLTS): 7-9 July 2014, Hotel Cap Roig, Platja d’Aro, Catalunya, Spain
First page
146
Last page
153
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/IOLTS.2014.6873687 Open in new window
Project funding
MICROARQUITECTURA Y COMPILADORES PARA FUTUROS PROCESADORES II
Microarquitectura i compiladors (ARCO)
Terascale reliable adaptive memory systems
Repository
http://hdl.handle.net/2117/27190 Open in new window
URL
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=6873687 Open in new window
Abstract
The vulnerability of the current and future processors towards transient errors caused by particle strikes is expected to increase rapidly because of exponential growth rate of on-chip transistors, the lower voltages and the shrinking feature size. This encourages innovation in the direction of finding new techniques for providing robustness in logic and memories that allow meeting the desired failures in-time (FIT) budget in future chip multiprocessors (CMPs) present in embedded systems. In emb...
Citation
Upasani, G.; Vera, X.; Gonzalez, A. Framework for economical error recovery in embedded cores. A: IEEE International On-Line Testing Symposium. "Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium (IOLTS): 7-9 July 2014, Hotel Cap Roig, Platja d’Aro, Catalunya, Spain". Platja d'Aro: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 146-153.
Keywords
Acoustics, Budget control, Chip multi-processors (CMPs), Embedded systems, Error detection, Exponential growth rates, Lower voltages, On-chip transistors, Scalable architectures, Shrinking feature sizes, Transient errors, Transistors, Wave detectors
Group of research
ARCO - Microarchitecture and Compilers

Participants

  • Upasani, Gaurang  (author and speaker )
  • Vera Rivera, Francisco Javier  (author and speaker )
  • Gonzalez Colas, Antonio Maria  (author and speaker )