Loading...
Loading...

Go to the content (press return)

Use of reference limits in the Feature Selective Validation (FSV) method

Author
Jaúregui, R.I.; Pous, M.; Silva, F.
Type of activity
Presentation of work at congresses
Name of edition
2014 International Symposium on Electromagnetic Compatibility
Date of publication
2014
Presentation's date
2014-09-02
Book of congress proceedings
2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden
First page
1031
Last page
1036
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
DOI
https://doi.org/10.1109/EMCEurope.2014.6931054 Open in new window
Repository
http://hdl.handle.net/2117/24758 Open in new window
URL
http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=6931054 Open in new window
Abstract
This paper presents a method for taking into account reference limits when the Feature Selective method (FSV) is applied. Nowadays, there is a long line of research that underlines the important role played by the FSV to perform an objective validation process. However, until now, there has been no consideration of a reference level in the validation process. This paper presents a methodology to calculate the FSV values when a reference limit is contemplated. We demonstrate the importance of thi...
Citation
Jaúregui, R.I.; Pous, M.; Silva, F. Use of reference limits in the Feature Selective Validation (FSV) method. A: International Symposium on Electromagnetic Compatibility. "2014 International Symposium on Electromagnetic Compatibility: September 1-4, 2014: Gothenburg, Sweden". Gotheborg: Institute of Electrical and Electronics Engineers (IEEE), 2014, p. 1031-1036.
Keywords
Computational Electromagnetics (CEM), Computer simulation, Data comparison, Feature Selective Validation method (FSV), Numerical simulation, Reference limits, Validation
Group of research
GCEM - Electromagnetic Compatibility Group
IEB - Electronic and Biomedical Instrumentation

Participants