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IEEE Electromagnetic Compatibility Magazine

Total activity: 2
ISSN
2162-2264 Open in new window
Publisher
Institute of Electrical and Electronics Engineers

Scientific and technological production

1 to 2 of 2 results
 
  • Alternative conducted immunity tests  Open access

     Çakir, Soydan; Sen, O.; Acak, Savas; Azpurua, M. A.; Silva, F.; Cetintas, M.
    IEEE Electromagnetic Compatibility Magazine
    Vol. 5, num. 3, p. 45-51
    DOI: 10.1109/MEMC.0.7764249
    Date of publication: 2016-12-14
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  • Alternative conducted emission measurements on mains without LISNs  Open access

     Pous, M.; Silva, F.
    IEEE Electromagnetic Compatibility Magazine
    Vol. 4, num. 4, p. 58-65
    DOI: 10.1109/MEMC.2015.7407180
    Date of publication: 2015-12-01
    Journal article
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