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IEEE Electromagnetic Compatibility Magazine

Total activity: 1
ISSN
2162-2264 Open in new window
Publisher
Institute of Electrical and Electronics Engineers

Scientific and technological production

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  • Alternative conducted immunity tests  Open access

     Çakir, Soydan; Sen, O.; Acak, Savas; Azpurua, M. A.; Silva, F.; Cetintas, M.
    IEEE Electromagnetic Compatibility Magazine
    Vol. 5, num. 3, p. 45-51
    DOI: 10.1109/MEMC.0.7764249
    Date of publication: 2016-12-14
    Journal article
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