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Reliability challenges in design of memristive memories

Author
Pouyan, P.; Amat, Esteve; Rubio, A.
Type of activity
Presentation of work at congresses
Name of edition
5th European Workshop on CMOS Variability
Date of publication
2014
Presentation's date
2014-10-29
Book of congress proceedings
2014 5th European Workshop on CMOS Variability (VARI 2014): Palma de Mallorca, Spain: 29 September-1 October 2014
DOI
https://doi.org/10.1109/VARI.2014.6957074 Open in new window
Repository
http://hdl.handle.net/2117/25636 Open in new window
Citation
Pouyan, P.; Amat, E.; Rubio, A. Reliability challenges in design of memristive memories. A: European workshop on CMOS Variability. "Proceedings VARI 2014". Palma Mallorca: 2014.
Group of research
HIPICS - High Performance Integrated Circuits and Systems

Participants

  • Pouyan, Peyman  (author and speaker )
  • Amat Bertran, Esteve  (author and speaker )
  • Rubio Sola, Jose Antonio  (author and speaker )

Attachments