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Structure, deformation and fracture of arc evaporated Zr-Si-N hard films

Author
Yalamanchili, K.; Forsen, R.; Jimenez-Pique, E.; Johansson, M.; Roa, J.J.; Ghafoor, N.; Oden, M.
Type of activity
Journal article
Journal
Surface and coatings technology
Date of publication
2014-11-15
Volume
258
First page
1100
Last page
1107
DOI
https://doi.org/10.1016/j.surfcoat.2014.07.024 Open in new window
Repository
http://hdl.handle.net/2117/26073 Open in new window
URL
http://www.sciencedirect.com/science/article/pii/S0257897214005969# Open in new window
Abstract
Zr-Si-N films with varying Si contents were grown on WC-Co substrates by reactive cathodic arc deposition technique. The resulting microstructures of the films correlate to dominant variation in mechanical properties and deformation mechanisms. Si forms a substitutional solid solution in the cubic ZrN lattice up to 1.8 at.% exhibiting a fine columnar microstructure. Further Si additions result in precipitation of an amorphous (a)-SiNx phase and evolution of a nanocomposite microstructure (nc ZrN...
Citation
Yalamanchili, K. [et al.]. Structure, deformation and fracture of arc evaporated Zr-Si-N hard films. "Surface and coatings technology", 15 Novembre 2014, vol. 258, p. 1100-1107.
Keywords
COATINGS, Deformation mechanisms, Fracture toughness, INDENTATION, MECHANICAL-PROPERTIES, MICROSTRUCTURE, NANOINDENTATION, Nanoindentation, Nanostructured film, SUPERHARD, THERMAL-STABILITY, THIN-FILMS, TRANSMISSION ELECTRON-MICROSCOPY, Transmission electron microscopy, Zr-Si-N
Group of research
CIEFMA - Structural Integrity, Micromechanics and Materials Reliability Centre
CRnE - Barcelona Research Center in Multiscale Science and Engineering

Participants